GEN3 Systems to Showcase CM-Series Ionic Cleanliness Tester Line at IPC/Apex 2012 |
GEN3 Systems, Ltd.
Unit B2
Hampshire, GU14 0NR
United Kingdom
Press release date: January 30, 2012
Farnborough, Hampshire, UK - Gen3 Systems, a global leader in solderability, cleanliness, and process optimization test equipment, will exhibit key systems from its CM‐Series (Contaminometer) product line at IPC/APEX 2012 in San Diego, California, February 28 - March 1, 2012, in Booth #617. The exhibit's centerpiece will be the new CM33L Large‐Format Ionic Cleanliness Test System, which represents GEN3's enhanced CM‐Series (a.k.a. Contaminometer) generation of testers. Also shown will be the Gensonic Ultrasonic Stencil Cleaner and MUST III Solderability (wetting balance) testing system.
The CM‐33L represents the entire enhanced CM‐Series product line. Those improvements and enhancements include newer operation and calculating software and enhanced measurement hardware, e.g., a unique CURVEFITTING Analysis algorithm; high volume pumps for faster test solution circulation - the CM re‐circulates/exchanges complete test solution 6 times per minute for faster test time and faster regeneration time; complete testing within only 3 minutes; and full regeneration and testing in <6 minutes. Additionally, all systems are also housed in a new package (skin).
GEN3 Systems' CM‐Series Ionic Cleanliness testers are an established industry leader with more than 2,000 systems installed worldwide. All of the CM‐Series testers include the following unique features:
o Fast (3 minute) Test Time;
o Full test cycle including regeneration time = < 6 minutes
o Unique solid gold measuring cell, ballistic amplifier providing a test accuracy of <0.005μS/cm;
o Unique CURVE‐FITTING Analysis algorithm (Merit of Fit);
o 2‐year warranty.
CM‐Series testers utilize a solid gold test‐cell, ballistic amplifiers, and high volume pumping systems to ensure superior measurement precision even at very low conductivity values. The high volume pumping system produces complete test solution change more than 6 times per minute, resulting in faster test times, more sensitive measurement, and superior surface contamination detection.
PC‐based software is used to produce graphical test data, a pass/fail analysis, and automatic hard copy print‐out using test methods according to the IPC and old MIL standards. CM‐Series testers measure in accordance with all recognized specifications including IPC‐TM‐650 method 2.3.25, IPC‐J‐STD 001 as well as MIL‐P‐28809 (obsolete but still referenced).
Gen3 Systems Ltd. is a leading global provider of specialized test equipment including Solderability (MUST System III wetting balance), SIR (Auto‐SIR), Ionic Cleanliness Test (CM‐Series) and Solder Paste Analysis (SPA1000) as well as Conformal Coating Systems both batch and in‐line non‐robotic. For more information, visit www.gen3systems.com. Gen 3 products are distributed in North America by Ascentech, LLC, web site: www.ascentechllc.com. For sales and technical information, contact Randy Allinson, Ascentech, 127 Goose Hill Rd., Chester, CT, 06412: Tel 860‐526‐8903, e‐mail rallinson@snet.net.
Press Contact:
Randy Allinson APEX 2012 Booth #617
Tel. 860-526-8903
E-mail: rallinson@snet.net
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