EDAX Offers Range of Technologies and Tools for Photovoltaic Applications |
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EDAX, Inc.
91 McKee Drive
Mahwah, NJ, 07430
USA
Press release date: July 27, 2010
MAHWAH, NJ - EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, offers a range of tools and technologies used in chemical characterization of photovoltaic materials. Measuring the composition of elements helps determine device performance. In addition, the distribution of specific elements can provide valuable information into grain boundary performance and localized electrical fields.
Among EDAX's latest innovations: Orientation Imaging Microscopy (OIM(TM)) 6.0 electron backscatter diffraction (EBSD) software-the first microanalysis software package to be written for a 64 bit processor and Microsoft® Windows 7 compatibility with datasets reaching >40 million data points. The software offers an easier path to the most commonly used functions along with one button analysis. Features include improved user access with advanced visualization tools, an interactive status bar, and a data processing log to automatically record post processing performed on datasets. All of these new enhancements benefit the user by improving their efficiency when doing analysis. In addition, improvements to the patented Chi-Scan technology, a combined EDS-EBSD tool for multiphase analysis developed by EDAX, offers enhanced phase differentiation, especially for nanoscale measurements. Together with OIM(TM) 6.0 software, EBSD techniques can be used to better understand the features of Photovoltaic thin film solar cells. The software assists in identifying possible inefficiencies of CdTe and CIGS thin films, providing an opportunity for yield improvement. EDAX offers the most comprehensive software package available for EBSD.
EDAX's EDS (Energy Dispersive Spectrometer) consists of the Apollo X Silicon Drift Detector and the TEAM(TM) EDS analysis system. The Apollo X detector series is available in a range of sizes and includes a large-area SDD chip offering. The detector is capable of mapping at both high resolution and high count rates, offering users the best of both worlds. The Apollo X is able to process a very high volume of X-rays making high-speed mapping possible without sacrificing resolution. EDAX defines high-resolution, high-speed mapping as better than 135eV resolution @ 100,000 cps and deadtime of 30% throughput. High speed mapping allows for the quicker identification of possible elemental defects in a sample.
TEAM(TM) EDS software includes Smart Features that represent a breakthrough in EDS analysis. The software allows users to obtain high quality, more reliable results by putting the knowledge of an EDS expert in every analysis system. Available to the user is guidance and dynamic map collection with Smart Phase Mapping. With built-in analytical intelligence and EDAX's revolutionary EXpert ID, the TEAM(TM) EDS software offers the most accurate peak identification and quantification available.
EDAX is an acknowledged leader in Energy Dispersive Microanalysis, Electron BackScatter Diffraction and X-ray Fluorescence Instrumentation. EDAX designs, manufactures, installs and services high-quality products and systems for leading companies in the photovoltaic, semiconductor, metals, geological, pharmaceutical, biomaterials and ceramics markets. Since 1962, EDAX has used its knowledge and experience to develop the latest silicon drift detector technology, digital electronics and specialized application software that facilitate solutions to research, development and industrial requirements.
EDAX is a unit of AMETEK Materials Analysis Division-a division of AMETEK, Inc., a leading global manufacturer of electronic instruments and electromechanical devices with 2009 sales of $2.1 billion.
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