CyberOptics Semiconductor's WaferSense® Airborne Particle Sensor Is Finalist for Prism Award |
Cyberoptics Semiconductor, Inc.
P.O. Box 276
Beaverton, OR, 97075 0276
USA
Press release date: November 17, 2011
CyberOptics' WaferSense® Airborne Particle Sensor is a finalist in the Prism Awards presented by SPIE and Photonics Media. The Prism Awardsis an international competition recognizing cutting-edge products that break conventional ideas and improve life through photonics. The program uniquely recognizes scientific innovation among trend-setting technological and industrial categories. The WaferSense Airborne Particle Sensor is one of three finalists in the category of Detectors, Sensing, Imaging, and Cameras.
The winner of the Prism Award will be announced at Photonics West scheduled Jan. 21 - 26 in San Francisco, CA.
To view the finalists, visit: http://www.photonicsprismaward.com/finalists.aspx What's Innovative about the WaferSense Airborne Particle Sensor?
A new particle detection methodology for tool qualification, the WaferSense Airborne Particle Sensor (APS) enables engineers to succinctly monitor and control contaminations in their tools and protect die yield with real-time views of particle conditions to address specific areas of concern instead of the whole tool.
Read more at: http://www.cyberopticssemi.com/node/127
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