Conference to focus on advances in biometrics.July 20, 2007 -
Biometric Consortium Conference 2007 on Sept. 11-13 in Baltimore, MD will be sponsored and supported by 17 federal and private organizations. John Marburger III, director of the Office of Science and Technology Policy, will be one of the keynote speakers. Agenda will include topics such as biometric-based government efforts and initiatives, prevention of ID theft, national and international standards development efforts, and adoption of biometric standards.
Conference to Focus on Latest Biometrics Advances |
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National Institute of Standards & Technology
100 Bureau Dr., Stop 1070
Gaithersburg, MD, 20899-1070
USA
Press release date: July 19, 2007
The latest trends in biometrics research and development, as well as the application of biometrics technologies in many important government programs and commercial settings, will be the topic of the Biometric Consortium Conference 2007 on Sept. 11-13, in Baltimore, Md. Sponsored and supported by 17 federal and private organizations, including the National Institute of Standards and Technology (NIST), this year's conference is expected to attract about 1,000 attendees and features 100 speakers; 60 representatives of local, state and federal agencies; and at least 75 exhibitors.
John Marburger III, director of the Office of Science and Technology Policy, Executive Office of the President, is one of this years' keynote speakers.
Topics on the agenda include biometric-based government efforts and initiatves, including solutions for homeland security applications such as airport security, travel documents, visas and border control; prevention of ID theft; advanced biometric systems; biometric interoperability and performance; national and international standards development efforts and adoption of biometric standards; research and evaluation of biometric technologies, commercial applications, user requirements and technological issues; and security of biometrics in government and commercial implementations and initiatives.
For further information including registration information, see: www.nist.gov/public_affairs/confpage/070911.htm.
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