Agilent Technologies' New Modular-Based Reference Solution for Multi-Channel Antenna Calibration Reduces Manufacturing Costs, Expands Test System Flexibility
Agilent Technologies, Inc.
5301 Stevens Creek Blvd.
Santa Clara, CA, 95051
Press release date: June 19, 2014
Agilent Technologies Method of Implementation Now Supports MIPI M-PHY v3.0 Interface S-Parameter and Impedance Testing Using ENA Network Analyzer
SANTA CLARA, Calif. -- Agilent Technologies Inc. (NYSE: A) today announced the availability of its Method of Implementation (MOI) document for the transmitter/receiver (Tx/Rx) interface S-parameter and impedance tests defined in version 3.0 of the MIPI Alliance Specification for M-PHY. The MOI, and a test package such as a state file, which makes setup and measurement easy, works with the ENA Series network analyzer's enhanced time domain analysis option (E5071C-TDR).
Mobile devices require a physical layer (PHY) capable of handling high-speed data signals with low-power consumption through their interfaces. MIPI M-PHY is a high-frequency, low-power PHY standard for protocols like DigRF v4, UniPro, LLI, CSI and UFS, which are used to connect devices such as displays, cameras, memory, or storage devices within mobile devices. To ensure these interfaces comply with the MIPI M-PHY specification, they must be tested under actual operating conditions and in accordance with the M-PHY Specification version 3.0.
Agilent's MOI eases this process by providing engineers with a measurement guide of procedures for the interface S-parameter and impedance tests defined in the latest MIPI M-PHY specification. Using the MIPI M-PHY v3.0 MOI and state files, semiconductor and product integrator manufacturers are able to more efficiently perform compliance tests to the standard with the E5071C-TDR.
"Agilent offers MOIs for many high-speed digital applications, such as HDMI, USB, PCI Express, SD Card and 10GBASE-KR/40GBASE-KR4 Ethernet." said Akira Nukiyama, vice president and general manager, Agilent's Component Test Division. "Our recent addition of an MOI for version 3.0 of the MIPI M-PHY standard is yet another example of how we are working to ensure our customers have the capabilities they need to address any high-speed measurement challenge."
The MIPI M-PHY v3.0 MOI for use with the E5071C-TDR is available now at www.agilent.com/find/ena-tdr_compliance. Additional information on MOI for transmitter/receiver interface S-parameter and impedance test is available at www.agilent.com/find/ena-tdr_mphy-txrx. Information on Agilent's M-PHY test solutions are available at www.agilent.com/find/mipi-mphy. An image of the new ENA Series network analyzer's enhanced time domain analysis option is available at www.agilent.com/find/ENA-TDR_MIPI_MOI_images.
About ENA Option TDR
The E5071C ENA-TDR is an application embedded in the ENA network analyzer that provides a one-box solution for high-speed serial interconnect analysis. The software delivers three breakthroughs for signal integrity design and verification: simple and intuitive operation, fast and accurate measurements simultaneously in the time domain (TDR/TDT) and frequency domain (S-parameter), and ESD robustness for reduction of maintenance cost.
About Agilent Technologies
Agilent Technologies Inc. (NYSE: A) is the world's premier measurement company and a technology leader in chemical analysis, life sciences, diagnostics, electronics and communications. The company's 20,600 employees serve customers in more than 100 countries. Agilent had revenues of $6.8 billion in fiscal 2013. Information about Agilent is available at www.agilent.com.
On Sept. 19, 2013, Agilent announced plans to separate into two publicly traded companies through a tax-free spinoff of its electronic measurement business. The new company is named Keysight Technologies, Inc. The separation is expected to be completed in early November 2014.
Janet Smith, Americas
+1 970 679 5397
Sarah Calnan, Europe
+44 (118) 927 5101
Connie Wong, Asia