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Press Release

EDAX, Inc.

Release date: May 1, 2008

EDAX Launches Apollo XV SDD

Latest Generation Silicon Drift Detector Broadens the EDAX X-ray Microanalysis Portfolio

May 01, 2008

MAHWAH, NJ - EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has launched the Apollo XV SDD, the latest generation of silicon drift detectors for X-ray microanalysis.

"Our latest addition to our Apollo Series SDD provides additional solutions for the X-ray microanalysis market by offering superior energy resolution and light element performance, "explains Del Redfern, Product Marketing Manager for EDAX.

"The new Apollo XV SDD utilizes the latest generation SDD chip technology leading to superior performance specifications, including energy resolutions of <128eV @ Mn K and <52eV @ C K," adds Redfern. "The new detector expands the EDAX portfolio of silicon drift detectors for all X-ray microanalysis applications, including accurate qualitative and quantitative analysis, fast and ultra fast X-ray mapping, phase analysis and complex particle analysis.

"The Apollo Series SDD is the perfect complement to our market-leading Genesis software, bringing all the advanced features for qualitative and quantitative analysis, mapping and particle analysis to the materials characterization scientist. The Apollo Series SDD fits seamlessly into the EDAX family of materials characterization tools, effortlessly integrating with our market-leading EBSD cameras and our technology-leading WDS systems," he notes.

"Finally, there is a complete range of SDD to satisfy all X-ray microanalysis applications, enabling the user to select the ideal EDS detector to solve their microanalysis problems," concludes Redfern.

EDAX is the acknowledged leader in Energy Dispersive Microanalysis, X-ray Fluorescence and Electron BackScatter Diffraction instrumentation. It designs, manufactures, installs and services high-quality products and systems for leading companies in the semiconductor, metals, geological, pharmaceutical, biomaterials, and ceramics markets.

Since 1962, EDAX has used its knowledge and experience to develop ultra-sensitive silicon radiation sensors, digital electronics and specialized application software that facilitate solutions to research, development and industrial requirements.

EDAX is a unit of AMETEK Materials Analysis Division. AMETEK, Inc. is a leading global manufacturer of electronic instruments and electromechanical devices with annualized sales of more than $2.1 billion.

For further information about EDAX, contact us at:
EDAX
Tel: (201) 529-4880
Fax: (201) 529-3156
E-mail: info.edax@ametek.com
Website: www.edax.com

Company Information:
Name: EDAX, Inc.
Address: 91 McKee Drive
City: Mahwah
State: NJ
ZIP: 07430
Country: USA
Phone: 201-529-4880
FAX: 201-529-3156
http://www.edax.com

More New Product News from this company:
Apr 5, 2004 - Microanalysis System combines EDS, EBSD, and WDS.
Aug 8, 2003 - Microanalysis Software includes Free Draw feature.
Jun 26, 2003 - Microanalysis Software displays up to 36 images.
Apr 7, 2003 - Machinery suit Electron Backscatter Diffraction.
Feb 5, 2003 - Analyzer measures coatings of small to mid-sized parts.
Jan 24, 2003 - Machine measures coating thickness of large parts.
Dec 4, 2002 - Software facilitates FDA 21 CFR Part 11 compliance.
Nov 15, 2002 - X-ray Microanalysis System utilizes various sensor types.
Oct 30, 2002 - Microanalysis System provides material characterization.
May 29, 2002 - Analysis Software works with X-Ray instrumentation.

Other News from this company:
Jun 20, 2007 - EDAX Announces Performance Enhancements for the Hikari Electron Backscatter Detector
Feb 14, 2007 - EDAX Launches Apollo SDD
Feb 01, 2007 - Ametek Names Rodrigo Rubiano As Business Unit Manager For EDAX
Jan 31, 2007 - AMETEK® Pittman Inc. and Avnet Electronics Marketing Sign Distribution Agreement
Jan 26, 2007 - AMETEK Forms Ultra Precision Technologies Division
Oct 27, 2006 - Department Of Homeland Security Selects Ametek To Supply Portable Radiation Detection System
Oct 02, 2006 - AMETEK Electromotory S.R.O. Marks 10th Anniversay
Sep 21, 2006 - Edax Showcases New HIKARI Electron Backscatter Detector at Microscopy and Microanalysis 2006
Aug 24, 2006 - Edax Showcases Texs HP, Parallel Beam X-ray Spectrometer at Semicon West
Aug 03, 2006 - Edax and Carl Zeiss SMT Showcase New OIM(TM) 3d EBSD at Microscopy and Microanalysis 2006
Jun 14, 2006 - Ametek Introduces the Ortec® Detective-EX-100 - Latest Advancement in Hand-Held Radiation Identifiers
May 12, 2006 - EDAX and xk INC Announce the Release of SLICE

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More related stories:
Jan 11, 2008 - Digital X-Ray Detector delivers 9.4 megapixel resolution.
Dec 26, 2007 - X-Ray Inspection System suits packaged and bulk products.
Aug 16, 2007 - Silicon Drift Detector is capable of low-energy detection.
Dec 6, 2006 - X-Ray Molecular Spectrometer helps identifiy potential threats.
Apr 26, 2006 - EDS System features 4-channel detector.
Sep 2, 2005 - X-Ray Detector suits protein crystallography.



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