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Strategic Test Corporation
Release date: September 26, 2006
Strategic Test Releases First 64-Bit Windows XP Driver for Digitizer, AWG and Fast Digital I/O Cards
Combined with a host PC having up to 128 GigaByte RAM, even longer signals to be recorded or replayed at high-speed - uses low-cost PC memory to reduce system cost Woburn, MA, USA - September 26, 2006. Strategic Test Corporation has announced the new Windows XP Pro 64-bit driver for its range of Digitizer, AWG, fast Digital I/O and Digital Pattern Generator cards. The driver is compatible with all of the 150 different PCI/PCI-X, PXI and CompactPCI products in the UltraFast(TM) range. There are two distinct advantages to 64-bit Windows over 32-bit. In the first case, 64-bit Windows delivers a higher computation performance that is a particular benefit to engineers and scientists who undertake real-time analysis of measurement data or signal processing. Secondly, 64-bit Windows supports up to 128 GigaByte of PC RAM (note 1) compared to the 4 GBytes of 32-bit Windows XP. This means that if the Digitizer or AWG card supports streaming (note 2), the signal data to/from the host-PC RAM and the total recording/replay rate is lower than the data transfer bandwidth of the PCI bus used, then the engineer can use the low-cost PC-memory instead of buying expensive instrument memory (note 3). This method also allows longer recording/replay times, as the maximum amount of signal memory that can be added to the current range of Digitizer or AWG cards from most vendors is 4 GBytes. To illustrate this further. A Digitizer card with two 100 MS/s 8-bit A/D channels will quantize the signals at a rate of 200 MBytes/second. In order for this data to be transferred continuously and gap-free to the host-PC memory, the PCI bus would need to support this data transfer rate. Assuming that the card is based on the 66 MHz / 32-bit PCI bus (also known as PCI-X) that is available on newer products, this bus supports continuous data transfer rates of up to 225 MBytes per second and therefore can be used to stream the data in this example. Using 32-bit Windows XP Pro, the maximum measurement time would be limited by the 3.5 GB useable memory giving a maximum time of 17.5 seconds. However, on a PC configured with 128 GB RAM running 64-bit Windows XP Pro, the measurement time would increase to over 6.5 minutes. The Windows XP Pro x64 driver is supplied at no cost and can be downloaded by existing customers from the company website. The same simple programming concept found in the other Windows and Linux drivers has been employed, allowing customers to upgrade their OS without modifying their application code. Further information on Windows XP Pro x64 can be found at Microsoft's website: http://www.microsoft.com/windowsxp/using/64bit/russel_exploringx64.mspx About Strategic Test With a product range of more than 150 high-speed Digitizer, Arbitrary Waveform Generator and high-speed Digital I/O PCI, 3U PXI and 6U CompactPCI cards, Strategic Test Corporation is one of the leading suppliers of high-speed PC-based instruments. The UltraFast cards are designed at the R&D facility in northern Germany and distributed through our offices in Woburn (MA) and Stockholm (Sweden).
The first high-speed measurement card for PC's was designed in 1989. The UF2 series based on the PCI-X 66 MHz/32-bit PCI bus is the forth generation and sets new standards in on board memory size, data transfer rates and user flexibility. Strategic Test's clients include global electronics, semiconductor, defense, telecommunications and medical instrument companies, government funded research labs and universities in five continents. A picture can be downloaded from the website at www.strategic-test.com/news For further information please contact: Bob Giblett President Strategic Test Corporation 12 Alfred Street, Suite 300 Woburn, MA 01801-1915 United States Tel: (617)621-0080 Fax: (617)621-1414 Email: media@strategic-test.com http://www.strategic-test.com
Contacts:
General Information:
Strategic Test Corporation
Bob Giblett President
12 Alfred Street, Suite 300
Woburn MA 01801
USA
Phone: 617-621-0080
FAX: 617-621-1414 E-mail this person
Company Information: Name: Strategic Test Corporation Address: 12 Alfred Street, Suite 300 City: Woburn State: MA ZIP: 01801-1915 Country: USA Phone: 617-621-0080 FAX: 617-621-1414 http://www.strategic-test.com
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