Keithley Instruments, Inc.
Cleveland, OH 44139
Share:
Parametric Test System offers comprehensive diagnostics.
To ensure system health, Model S530 includes GUI-driven tool that expands diagnostic coverage for all system instrumentation and matrix pathways. KTE v5.5 addresses all I-V and C-V measurements required in process control monitoring, process reliability monitoring, and device characterization. In addition to 200 V system configuration used for standard CMOS, bipolar, and MEMS processes, 1 kV...
Read More »
Keithley's Model 2657A High Power System SourceMeter-® Instrument Named One of EDN's 2012 Hot 100 Products
Cleveland, Ohio- Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, announced today that the editors of EDN Magazine have named the Model 2657A High Power System SourceMeter instrument as one of the 100 Hot Products of 2012. The 2012 EDN Hot 100 highlights the electronics industry's most significant products of the year based on innovation,...
Read More »Cabling Kits handle I-V, C-V, and pulsed I-V signals.
Compatible with Model 4200-SCS Semiconductor Characterization System, Triaxial Cable Kits are based on design that speeds process of making DC Current-Voltage, Capacitance-Voltage, and pulsed I-V testing connections from any semiconductor parameter analyzer to Cascade Microtech or SUSS MicroTech prober. Kits eliminate need for recabling when switching between measurement types, which in turn...
Read More »Semiconductor Analysis System supports solar cell testing.
Model 4200-SCS Semiconductor Characterization System is available with Keithley Test Environment Interactive (KTEI) v7.2, which provides 9 solar cell test libraries that expand capabilities for I-V, C-V, and resistivity testing applications. Software also supports Drive-Level Capacitance Profiling (DLCP) solar cell testing technique. In addition to 1 kHz to 10 MHz frequency range, parametric...
Read More »Keithley to Develop RF WiMAX Production Test Solution for Fujitsu Microelectronics' New WiMAX PCMCIA Card and WiMAX USB Dongle Devices
CLEVELAND, OH, Nov 24, 2008 -- Keithley Instruments, Inc. (NYSE: KEI), a leader in solutions for emerging measurement needs, announced today that it is developing a WiMAX device production test solution for two 802.16e WiMAX devices from Fujitsu Microelectronics Limited. This WiMAX RF SISO/MIMO manufacturing test configuration features Keithley's award-winning RF test solutions, the Model 2820 RF...
Read More »Software provides RF signal generation and analysis.
Featuring block diagram-based GUI, SignalMeister(TM) RF Communications Toolkit enables research, design, and test engineers to generate and analyze both SISO and MIMO signals in same environment. Program supports wireless MIMO protocol standards, WiMAX Wave 2, and 802.11n WLAN. It also provides complex functionality such as WLAN channel modeling, beamforming, and simulation studies, along with...
Read More »Keithley Partners with Stratosphere Solutions to Enable Advanced Process Characterization at Sub-65nm
Partnership delivers silicon-proven interoperable solution to drive parametric yields higher Cleveland, Ohio - February 11, 2008 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces a partnership with Stratosphere Solutions, Inc. (Sunnyvale, CA), a provider of innovative parametric yield improvement solutions for integrated circuit...
Read More »Keithley - Industry-Leading Capabilities for MIMO RF Signal Generators and Analyzers
October 15, 2007 Introduced as the industry's leading 4X4 MIMO (multiple-input, multiple-output) RF test system for R&D and production testing of next generation RF communications equipment and devices, new instruments have been announced by Keithley. The MIMO RF test system consists of its new Model 2920 Vector Signal Generator (VSG) and Model 2820 Vector Signal Analyzer (VSA), Model 2895 MIMO...
Read More »Parametric Test Systems use Linux controllers.
With RF and parallel test options as well as appropriately designed test structures and probe cards, Model S680 can make simultaneous DC and RF measurements in parallel within same probe touchdown. Series S600 systems are also available with adaptive test option and 300 mm wafer automation option. They include KTE v5.2.2 software, Red Hat Enterprise Linux WS v4, Update 4, and x86-based computer.
Read More »Digital Multimeter features USB-based design.
Featuring 10 Vdc accuracy of 38 ppm, Model 2100 provides 6Ã-½-digit resolution at measurement rate of 50 readings/sec over USB bus. At 4Ã-½ digits, unit delivers more than 2,000 readings/sec into internal data buffer. Measurement functions cover Volts, Ohms, Amps, and RTD temperature as well as MX+B, dB, and dBm math modifiers. Available in bench, portable, or small system configurations,...
Read More »
Parametric Test System offers comprehensive diagnostics.
To ensure system health, Model S530 includes GUI-driven tool that expands diagnostic coverage for all system instrumentation and matrix pathways. KTE v5.5 addresses all I-V and C-V measurements required in process control monitoring, process reliability monitoring, and device characterization. In addition to 200 V system configuration used for standard CMOS, bipolar, and MEMS processes, 1 kV...
Read More »Keithley Web-Based Seminar Teaches Low Level DC Measurement Techniques
Cleveland, Ohio –Ã- Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, is offering a free, web-based seminar titled “Techniques for Making Successful Low Level DC Measurements.” This event, which is available for on-demand viewing, describes the basics of low current electrical measurements, including how to select the right current...
Read More »
Keithley's Model 2657A High Power System SourceMeter-® Instrument Named One of EDN's 2012 Hot 100 Products
Cleveland, Ohio- Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, announced today that the editors of EDN Magazine have named the Model 2657A High Power System SourceMeter instrument as one of the 100 Hot Products of 2012. The 2012 EDN Hot 100 highlights the electronics industry's most significant products of the year based on innovation,...
Read More »Keithley Publishes E-Handbook on Precision Low Current, High Resistance Measurements
CLEVELAND, Ohio - April 27, 2011 - Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has published an informative e handbook titled Making Precision Low Current and High Resistance Measurements. A free copy can be downloaded from Keithley's website at http://www.keithley.com/pr/088. The e-handbook covers several topics crucial to ensuring low current...
Read More »Keithley Publishes E-Guide to High Performance Digital Multimeters
CLEVELAND, Ohio - April 12, 2011 - Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has published an informative e-guide titled High performance DMMs for single- and multi-channel applications. A free copy is downloadable upon request from Keithley at: http://www.keithley.com/pr/084. The e-guide provides an overview to the features and advantages of...
Read More »Free Keithley Web-Based Seminar Explores Graphene Characterization Techniques
CLEVELAND, Ohio - March 16, 2011 - Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled Mastering Low Power, Low Voltage, Low Resistance Measurement Techniques for Characterizing Graphene and Other Nano Materials on Thursday, March 24, 2011. This one-hour seminar will present techniques for making low...
Read More »Keithley Releases Four New How-To Videos on Operating Electrometers
CLEVELAND, Ohio - February 15, 2011 - Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has produced a series of four new tutorial videos on topics related to configuring and operating one of its most sensitive measurement instruments. The videos, which range from one to four minutes in length, focus on the Model 6517B Electrometer/High Resistance...
Read More »Free Keithley Webinar Teaches Fundamentals of Hall Effect Measurements
CLEVELAND, Ohio - February 7, 2011 - Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, will broadcast a free webinar on Hall Effect Measurement Fundamentals on Thursday, February 17, 2011. This one-hour presentation will introduce Hall effect measurements as they relate to semiconductor materials and device characterization. The on-line event also...
Read More »Keithley Instruments Acquired by Danaher Corporation
CLEVELAND, Dec. 8, 2010 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, today announced completion of the merger of Aegean Acquisition Corporation, an indirect wholly owned subsidiary of Danaher Corporation, into Keithley pursuant to the previously announced Merger Agreement dated September 29, 2010 among Danaher Corporation, Aegean...
Read More »Keithley Instruments Releases 11 New 'How-To' Videos on Configuring and Operating Source-Measure Units
CLEVELAND, Dec. 7, 2010 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, has produced a series of 11 new tutorial videos on topics related to configuring and operating one of their most popular product types, Source-Measure Units (SMUs). The videos, which range from one to four minutes in length, focus on the award-winning Series 2400...
Read More »