Company News

Agilent Technologies, Inc.

5301 Stevens Creek Blvd., Santa Clara, CA, 95051, USA

  • 800-227-9770

General Information:
Janet Smith
Phone: 970-679-5397
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Latest New Product News from
Agilent Technologies, Inc.

software, test & measuring instruments

Compliance Test Applications target 100G Ethernet systems.

July 15, 2014

Designed to accelerate turn-on and debugging of 100 Gigabit Ethernet networking systems, Agilent N8830A 100GBASE-CR4, N8829A 100GBASE-KR4, and N8828A 40GBASE-CR4/100GBASE-CR10 Test Applications automate execution of physical-layer tests on Agilent Infiniium 90000 X-Series and 90000 Q-Series oscilloscopes as well as Z-Series oscilloscopes with up to 63-GHz bandwidth. Engineers can automate applications to run over extended periods of time, and add incremental user-defined tests. Read More

electronic components & devices, software

Waveform Creation Software accelerates device development.

July 10, 2014

Targeting developers of radars, satellite communications, military radios, and next generation of DOCSIS 3.1 cable modems, M9099 Waveform Creator v2.0 provides waveform segment types that can be combined into multiple tracks and aggregated into one composite waveform. Capabilities let users build or import various signals, mix them together, and add IQ impairments and noise to simulate real-world environments. Drag-and-drop interface facilitates creation of complex composite waveforms. Read More


Compliance Test Software verifies DDR4 designs.

July 9, 2014

Offered as add-on to Advanced Design System 2014.01 software, DDR4 Compliance Test Bench enables complete workflow for DDR4 engineers, from simulation through measurement of finished prototype. Program uses simulation to ensure that candidate design yields fabricated prototype compliant to voltage and timing specifications of JEDEC DDR4 standard. Post-processing scripting capability, known as Waveform Bridge, exports simulated waveforms to compliance application used with Infiniium oscilloscopes. Read More

test & measuring instruments

Power Device Capacitance Analyzer aids power circuit design.

July 9, 2014

Able to measure all parameters for high-frequency switching power supplies, B1507A automatically evaluates all input, output, and reverse transfer power device capacitance. Measurement capabilities specifically include 3 terminal capacitances (Ciss, Coss, and Crss) with high-voltage bias (±3 kV); gate resistance (Rg); as well as leakage current and breakdown voltage. GUI facilitates measurement under range of operating voltages. Read More

test & measuring instruments

PXI-based Test System accelerates LTE waveform creation.

July 7, 2014

Providing tools to generate complex LTE/LTE-A multi-channel/MIMO waveforms and analyze multiple channels in frequency and modulation domains simultaneously, LTE/LTE-Advanced Multi-channel PXI-based Test Solution helps engineers gain deep insight into complex carrier aggregation and spatial multiplexing MIMO designs. Chassis backplane trigger tool configures and routes backplane triggers for proper time synchronization in MIMO configuration for up to 2 PXIe chassis. Read More

electrical equipment & systems, services, test & measuring instruments

AC Power Sources support electronic device testing.

July 1, 2014

Comprising 4 models ranging from 500–4,000 Vac output power, AC6800 Series is suitable for powering devices under test. Intuitive user interface enables engineers to access and view setup and measurement information directly from front panel or programmatically via SCPI commands. Sources come standard with LAN/LXI Core and USB interfaces and offer GPIB interface as option. With LXI Core interface, engineers can set up and control power supplies remotely via standard Web interface. Read More

test & measuring instruments

Impedance Analyzers offer flexible frequency options.

June 20, 2014

Designed for engineers characterizing and evaluating passive electronic components and semiconductor devices, Agilent E4990A features frequency range of 20 Hz to 10/20/30/50/120 MHz and 0.045% basic accuracy, while E4991B offers frequency range of 1–500 MHz or 1 GHz/3 GHz and basic accuracy of 0.65%. E4991B additionally provides material measurement options that include temperature characteristics analysis from -55 to 150°C and direct read function of permittivity and permeability. Read More

test & measuring instruments

Signal Analyzer supports Windows 7.

June 12, 2014

For RF applications, N9000A CXA X-Series offers -110 dBc/Hz at 10 kHz offset and 1 GHz center frequency for up to 10 dB phase performance improvement. Unit is equipped with 64-bit CPU with 4 GB RAM to maximize benefits of Windows 7 OS. For microwave uses, analyzer adds 7 measurement applications for testing cellular communications, 2 applications for testing Mobile WiMAX™ and WLAN 802.11a/b/g/n devices, and 5 applications for testing digital video technologies. Read More


EDA Software incorporates 4G design and validation support.

June 10, 2014

Agilent EEsof EDA W1918 LTE-Advanced baseband verification library supports such 4G technologies as Adaptive Modulation and Coding (AMC) and Coordinated Multi-Point (CoMP). Accelerating design and verification process for 4G chipsets and infrastructure as well as deployment, modeling and simulation capabilities enable wireless system architects to model sophisticated dynamic behaviors and realistic performance at cell edges according to PHY specifications of 3GPP Releases 10 and 11. Read More


RF and Microwave Design Software supports modulated RF signals.

June 5, 2014

Serving circuit and system designers, Genesys 2014 RF simulation and synthesis software, in one pass, delivers breakthrough system budget analysis for EVM, BER or ACPR modulation metrics for every component in system block diagram. Designers can simulate digitally modulated RF signals, and embedded numeric dataflow simulator enables verification against wireless standards for WLAN 802.11ac and LTE-3GPP. Also, multiple custom filters can be interactively designed together. Read More

optics & photonics

Atomic Force Microscope offers ILM and STM capabilities.

June 3, 2014

Equipped with 90 µm AFM closed-loop scanner, Agilent 7500 achieves low-noise performance, enabling atomic-resolution imaging. Design includes built-in environmental chamber with 6 inlet/outlet ports as well as precision temperature and humidity sensors. Inverted Light Microscope system supports MAC Mode for gentle imaging of fluids, while Scanning Tunneling Microscope system provides stable imaging at pA and sub-pA currents to resolve individual atoms and molecules. Read More


PCIe High-Speed digitizers incorporate averager capability.

June 2, 2014

Both 8-bit U5309A and 12-bit U5303A offer averager real-time processing function (-AVG), with averaging up to 520,000 triggers per record and self-trigger mode, to minimize synchronous pattern noise within application. Sampling rate of up to 3.2 GSPS is achieved via single trigger and acquisition, and does not require use of equivalent-time sampling techniques. Software driver included with digitizer allows application to switch between signal processing functions. Read More

test & measuring instruments

EXM Wireless Test Set supports 4x4 true MIMO evolution.

May 30, 2014

EXM wireless test set supports 4x4 True MIMO capability for WLAN design and validation with up to 4 TRXs testing multiple-input, multiple-output antenna characteristics simultaneously. WLAN combined measurements support transmitter beam-forming test for device calibration testing, while independent source and analyzers for parallel receiver and transmitter testing further accelerate and optimize WLAN device manufacturing. TRX modules are upgradable up to 160 MHz bandwidth and 6 GHz frequency. Read More

computer hardware & peripherals, test & measuring instruments

Network Analyzer supports automatic fixture removal option.

May 29, 2014

PNA Series network analyzers support automatic fixture removal (AFR) option, which provides error-correction technique that facilitates accurate measurement of non-coaxial devices. Through 5-step wizard that guides engineer, AFR option provides accelerated and accurate means of removing fixture effects from non-coaxial device measurements. De-embed files can be saved in various formats for later use in PNA, PLTS, and Advanced Design System software. Read More


EDA Software simulates moving 3D radar scenarios.

May 29, 2014

Available as simulation option to SystemVue, W1905 Radar Model Library realistically renders radar and electronic warfare environments throughout the R&D process. Software adds inertial modeling layers above baseband radar signal processing references. They account for 3-D positions, velocities, rotations, and beamforming directions of each transmitter, receiver, and target, allowing modelers to create and script meaningful airborne, shipborne, and multi-static scenarios or environments. Read More

test & measuring instruments

Impedance Analyzers offer flexible frequency options.

May 28, 2014

Respectively offering 0.045% and 0.65% typ basic accuracy, E4990A and E4991B are designed for R&D, QA, and for inspection engineers characterizing and evaluating passive electronic components, semiconductor devices, and materials. Products collectively evaluate components from milliohm to megaohm over 20 Hz to 3 GHz frequency range. Material measurement options of E4991B include temperature characteristics analysis from -55 to +150°C and direct read function of permittivity and permeability. Read More

test & measuring instruments

BGA Interposers accelerate probing of DDR3 and DDR4 designs.

May 22, 2014

While Agilent W4633A BGA interposer is used with Agilent E5849A probes for high-data-rate DDR4 x4 or x8 DRAM designs, Agilent W3636A BGA interposer lets engineers probe DDR3 x16 nonstacked DRAM more than 2 G deep. Both interposer solutions, which capture address, command, and data signals for debugging designs and making validation measurements, are designed for use with Agilent U4154A logic analyzer system and support data rates testing beyond 2,400 Mbps. Read More

optics & photonics

AFM Accessory enables scanning electrochemical microscopy.

May 20, 2014

AFM-enabled Scanning Electrochemical Microscopy (SECM) mode, using Agilent atomic force microscope, lets scientists perform scanning electrochemical microscopy with nanoscale resolution on conductive and insulating samples. Enabling immediate data collection, EC SmartCart cartridge combines nanoelectrode with pre-mounted AFM tip. Features include bi-functional probes, in situ research capabilities, built-in potentiostat, dual-chamber glove box, and Agilent PicoView software. Read More

test & measuring instruments

Signal Analyzers offer high frequency stability.

May 13, 2014

Through optional Noise Floor Extension feature, MXA X-Series Signal Analyzers yield up to 9 dB sensitivity improvement over MXA versions without NFE. MXA and EXA models achieve high frequency stability with atomic frequency reference option, which offers 100X improvement in long-term frequency stability. High-frequency coverage for MXA is possible via external mixing option, which covers frequencies beyond 26.5 GHz and up to 110 GHz with Agilent M1970 smart mixers. Read More

test & measuring instruments

Power Device Analyzer facilitates circuit design.

May 13, 2014

With intuitive GUI, Agilent B1506A automatically characterizes all power device parameters across temperatures from -50 to +250°C, at up to 1,500 A and 3 kV. Unit measures and evaluates IV parameters such as breakdown voltage and on-resistance; 3 terminal capacitances of Ciss, Coss, and Crss with high-voltage bias; gate charge; switching time; and power losses. Oscilloscope view supports visual verification of pulsed measurement waveforms for checking real operating bias/timing point. Read More

Other Company News from
Agilent Technologies, Inc.