GOEPEL electronics LLC
Austin, TX 78759
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TAP Interface Card adds analog opens/shorts tests to SCANFLEX-®.
Model TIC02/PMU enables test of peripheral networks for shorts and open connections without powering up unit under test (UUT). It features powerless measurement unit that is interposed as signal source to UUT's operation voltage connections, as well as test generator that recognizes connected I/O test channels and generates parametric control sequences. Product connects to any TAP slot of...
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Multifunctional Controllers handles extend boundary scan testing.
Working within framework of Boundary Scan hardware platform SCANFLEXÃ-®, desktop SFX/COMBO1149-(x) series enables combination of numerous strategies for testing, programming, as well as design validation. It supports new and upcoming standards, such as IEEE 1149.7 and IEEE P1687 and offers hardware extension slots to provide additional scalability. Series provides USB2.0 and Gbit LAN...
Read More »Microcontroller IP Model Libraries support JTAG/Boundary Scan.
Structured modularly as intelligent IP, VarioTAPÃ-® models for Microchip PIC32MX microcontrollers with MIPS(TM) Core enable complete fusion of boundary scan test and JTAG emulation. By employing this technology, on-chip Flash of PIC32MX types can be in-system programmed. Both embedded Flash and external Flash are supported. In addition, VarioTAPÃ-® supports interlaced bus emulation tests...
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Boundary Scan Controller complies with PCI bus specification.
SCANBOOSTER/PCI-DT boundary scan controller supports JTAG/Boundary Scan tests, VarioTAPÃ-® emulation tests, and in-system programming for PLD/FPGA as well as Flash serial EEPROM devices. Product consists of PCI plug-in card, external Test Access Port (TAP) transceiver unit, and 2 separate TAPs that can be programmed independently. Additional resources include 32 voltage-level-programmable,...
Read More »Testing Software automates true hierarchical board test.
With SYSTEM CASCON(TM) Automatic Test Program Generator, users can generate board-centric Boundary Scan tests on basis of true library models of conventional components. Test programs are defined by Source Code in CASLAN, which provides more than 250 commands, and enables algorithmic vector generation, adaptive fault diagnosis, mixed signal test, and file handling. ATPG analyzes connection...
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Interface Cards support ultra-low voltage applications.
TAP Interface Cards (TIC) TIC02/LV are designed for low- and ultra-low-voltage applications and also support GTL interfaces. They provide externally programmable voltage from 0.5-2 V, which may also be used to actuate GTL/GTL+ interfaces, and input voltage can be regulated from 0-2 V. Connection of TIC to TAP transceiver is differential, promoting safe data transfer over distances up to several...
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Digital I/O Module combines boundary scan/at-speed test.
Model SFX-5364 SCANFLEXÃ-® I/O module features 64 programmable I/O channels and is configurable for structural Boundary Scan operations and protocol-based at-speed tests up to 100 MHz through integrated VarioCoreÃ-® technique. Each channel is configurable as In/Out/Bidir/Tri-state and groups of 32 I/O each can be adjusted from 1.8-4.5 V in 0.1 V steps. It supports interconnection or...
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Module enables angled viewing for AOI systems.
Designed for Automated Optical Inspection (AOI) systems, module provides maximized image quality at 45Ã-
Read More »Boundary Scan Platform SCANFLEX-® Successfully Integrated into Teradyne In-Circuit Tester
Jena / Munich - At the Electronica 2007 trade show in Munich, Germany, GOEPEL electronic, a worldwide leading vendor of JTAG/Boundary Scan solutions compliant with IEEE Std. 1149.x, will introduce a JTAG/Boundary Scan integration option for the Teradyne TestStation(TM) in-circuit tester (ICT) series. The solution has been developed based on an OEM agreement, utilizing specifically designed...
Read More »TAP Interface Card adds analog opens/shorts tests to SCANFLEX-®.
Model TIC02/PMU enables test of peripheral networks for shorts and open connections without powering up unit under test (UUT). It features powerless measurement unit that is interposed as signal source to UUT's operation voltage connections, as well as test generator that recognizes connected I/O test channels and generates parametric control sequences. Product connects to any TAP slot of...
Read More »
Multifunctional Controllers handles extend boundary scan testing.
Working within framework of Boundary Scan hardware platform SCANFLEXÃ-®, desktop SFX/COMBO1149-(x) series enables combination of numerous strategies for testing, programming, as well as design validation. It supports new and upcoming standards, such as IEEE 1149.7 and IEEE P1687 and offers hardware extension slots to provide additional scalability. Series provides USB2.0 and Gbit LAN...
Read More »GOEPEL Electronic Continues Webinar Series on Automated Optical Inspection
GOEPEL electronic will run four additional webinars about Automated Optical Inspection (AOI) issues on throughout February 2011. The events will start at 11 am EST and will last about one hour each. The first webinar on February 3rd will provide an overview of test/inspection capabilities of Automated Optical Inspection (AOI) systems in general, with a discussion of technology specific advantages...
Read More »GOEPEL Electronics and Geotest to Host Seminars in the Baltimore and Washington DC Area
Combining Design for Test Analysis Methods with Boundary Scan and Functional Test - Advantages and Techniques GOEPEL electronics LLC and Geotest will run free seminars and workshops that review the most recent advances in JTAG/Boundary Scan technology and Functional Test strategies. The events will take place in Linthicum, MD, and Rockville, MD, on October 27th and 28th, respectively. Attendees...
Read More »Cooperation between GOEPEL Electronic and IPextreme Accelerates Support of IEEE1149.7 (cJTAG)
GOEPEL electronic, globally leading vendor of JTAG/Boundary Scan solutions compliant with IEEE Standard 1149.x and IPextreme, a supplier of high-quality IP (Intellectual Property) for System-on-Chip (SoC) Design worldwide, have verified new instrumentations for the recently adopted debug and test standard IEEE 1149.7 within the frame work of a long-term cooperation. As a result, the total...
Read More »Microcontroller IP Model Libraries support JTAG/Boundary Scan.
Structured modularly as intelligent IP, VarioTAPÃ-® models for Microchip PIC32MX microcontrollers with MIPS(TM) Core enable complete fusion of boundary scan test and JTAG emulation. By employing this technology, on-chip Flash of PIC32MX types can be in-system programmed. Both embedded Flash and external Flash are supported. In addition, VarioTAPÃ-® supports interlaced bus emulation tests...
Read More »
Boundary Scan Controller complies with PCI bus specification.
SCANBOOSTER/PCI-DT boundary scan controller supports JTAG/Boundary Scan tests, VarioTAPÃ-® emulation tests, and in-system programming for PLD/FPGA as well as Flash serial EEPROM devices. Product consists of PCI plug-in card, external Test Access Port (TAP) transceiver unit, and 2 separate TAPs that can be programmed independently. Additional resources include 32 voltage-level-programmable,...
Read More »Testing Software automates true hierarchical board test.
With SYSTEM CASCON(TM) Automatic Test Program Generator, users can generate board-centric Boundary Scan tests on basis of true library models of conventional components. Test programs are defined by Source Code in CASLAN, which provides more than 250 commands, and enables algorithmic vector generation, adaptive fault diagnosis, mixed signal test, and file handling. ATPG analyzes connection...
Read More »
Interface Cards support ultra-low voltage applications.
TAP Interface Cards (TIC) TIC02/LV are designed for low- and ultra-low-voltage applications and also support GTL interfaces. They provide externally programmable voltage from 0.5-2 V, which may also be used to actuate GTL/GTL+ interfaces, and input voltage can be regulated from 0-2 V. Connection of TIC to TAP transceiver is differential, promoting safe data transfer over distances up to several...
Read More »