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Latest New Product News from
GOEPEL electronics LLC

Electronic Components & Devices

FPGA Chips facilitate test and debug.

November 26, 2014

Available for Altera® System-on-Chips, VarioTAP® and ChipVORX® Chips combine FPGA logic with Hard Processor System in single package, serving as embedded instruments for test and programming of solutions they are fitted to. VarioTAP® uses native debug port to control test operations and programming functions via processor elements. ChipVORX® technology exploits capability of using FPGA embedded instruments in form of softcore IP in FPGA elements. Read More

Test & Measuring Instruments

Evaluation Board for CION LX facilitates test and development.

June 2, 2014

Designed to demonstrate technical test capabilities of CION LX JTAG controllable Tester on Chip (ToC), CION LX Evaluation Board (EVB) lets users verify all operating modes as well as develop applications and test scenarios. Circuit pins are accessible via connectors, and board also provides such additional resources as LEDs and adjustable clock generator up to 170 MHz. Control of features is carried out via JTAG port, and TAP connector allows direct access via Boundary Scan controllers. Read More

Test & Measuring Instruments, Computer Hardware & Peripherals

Interface Card supports boundary scan and processor emulation.

March 14, 2014

Available for SCANFLEX® Boundary Scan hardware platform, Model TIC122 features programmable multi-bus interface enabling nearly unlimited compatibility with standardized and proprietary microprocessor debug protocols and simultaneously supporting all Boundary Scan standards. Active test head is specifically developed for in-fixture utilization with adaptive streaming technology VarioTAP®. In addition to bus signals, it provides emulation signals that can be integrated in streaming procedure. Read More

Test & Measuring Instruments

Parallel Test and Programming Kit targets gang applications.

December 10, 2013

Offering complete solution for applications based on Embedded System Access (ESA) technologies, SFX Gang Test Module Kit may be used for parallel test and programming of up to 16 or 32 different assemblies with integrated Mass Interconnect Interface. Kit comprises 3 interconnected modules – TAP transceiver, multipurpose parallel I/O unit, and power management unit – that have onboard Mass Interconnect Interfaces and are centrally controlled. Read More

Test & Measuring Instruments, Machinery & Machining Tools

Inline Production System supports programming and board test.

December 9, 2013

Designed for in-system programming and board test based on Embedded System Access technologies, RAPIDO™ can utilize planar downholders in sandwich construction to safely handle ultra-thin, rigid-flexible boards with contact gaps up to 50 mil. All fixtures are equipped with intelligent module for identification and data storage, ensuring compatibility between fixture and target board. In addition, bandwidth, UUT, and test program can be automatically configured to avoid manual faults. Read More

Software

IP Model Library fosters integration of Xilinx Kintex7 FPGAs.

November 6, 2013

Promoting ChipVORX® technology utilization, IP model library for Xilinx® Kintex7 FPGA family enables fully automatic usage of native design-integrated FPGA for execution of various at-speed test and programming tasks utilizing JTAG interface and special softcores. Without detailed FPGA knowledge, users can test DDR(x) memories, measure cycle frequencies, verify high-speed I/O by BERTs and eye diagram visualization, as well as program Flash memories at high speed. Read More

Test & Measuring Instruments, Software

Boundary Scan Test System handles complex projects.

July 17, 2013

Comprising hardware and software, SCANFLEX® Designer Studio is designed for test and debug tasks in complex projects in both design and production stages. Hardware is preconfigured for utilization of Embedded System Access technologies, and can be extended by additional I/O modules for further test and programming tasks. Offered in 3 versions, bundle's performance level may be upgraded from pure test to in-system programming of moderate Flash and PLDs, up to operations with layout visualization. Read More

Test & Measuring Instruments

JTAG Boundary Scan Tester features desktop form factor.

May 7, 2013

Combining all test electronics and basic mechanics, modular JULIET™ series supports all Embedded System Access (ESA) technologies for high-speed, in-system programming of Flash, PLD, and MCU as well as structural and functional at-speed board test. In addition to Boundary Scan, unit supports such test strategies as Processor Emulation and Chip Embedded Instruments respectively based on VarioTAP® and ChipVORX® technologies. Universal adaptors are supplied as standard. Read More

Test & Measuring Instruments

Inline Production System programs non-volatile memories.

May 2, 2013

Developed for in-system programming of non-volatile memories such as Flash, MCUs, and PLDs, RAPIDO™ RPS3000-S32XL provides surface for multi-board panels up to 500 x 500 mm. System, based on Embedded System Access (ESA) technologies and SCANFLEX® architecture with Short Wire Interface for up to 32 sites, supports double-sided probing for up to 3,000 nails. Functionality also allows for combination of programming tasks with various test strategies. Read More

Computer Hardware & Peripherals, Controls & Controllers

Boundary Scan Controller features wireless LAN interface.

October 29, 2012

Providing Triple Stream/Dual Band WLAN interface for theoretical transmission speed up to 450 Mbps, SFX/WSL1149-(x) Series enables wireless utilization of Embedded System Access technologies for testing, programming, and debugging of complex chips, boards, and systems. Controller is compatible with IEEE standard 802.11a/b/g/n and provides both USB 2.0 and Gigabit Ethernet interfaces. Three models of different performance classes can be configured by software, enabling TCK frequencies up to 80 MHz. Read More

Software

Model Libraries support Altera Arria®V FPGA devices.

September 6, 2012

Consisting of Intellectual Properties for implementation and control of chip embedded instruments, ChipVORX® models enable multitude of FPGA-assisted test and programming functions, such as programming of parallel NOR and NAND-Flash, frequency measurement, and high-speed programming of serial Boot Flash. Within ChipVORX framework, instruments are temporarily loaded, configured, and finally controlled as soft macros via standard IEEE 1149.1 TAP into FPGA. Read More

Electrical Equipment & Systems, Electronic Components & Devices

Galvanic Isolator improves serial scan interference immunity.

August 29, 2012

Designed for applications in critical signal environments requiring interference immunity and potential isolation, TAP-Isolator module enables complete galvanic insulation of Test Access Port (TAP) transceiver from target. This box can be used in each scan path and separates transceiver's primary TAP interface from target's secondary TAP interface. Potential isolation eliminates mutual interference between TAP transceiver/target, increasing functional safety of Boundary Scan applications. Read More

Test & Measuring Instruments

Boundary Scan I/O Module processes voltages up to 30 V.

August 22, 2012

Offering VarioCore® technology for dynamic configuration of module-specific FPGA based functions, SCANFLEX® SFX5212 provides 12 channels with driver performance up to 150 mA, independently programmable as input, output, or tri-state. I/O voltage may be programmed onboard or externally supplied. While module acts statically in Boundary Scan mode, supporting interconnection test or cluster test procedures, functional mode supports protocol generator, data recorder, or counter/timer functions. Read More

Test & Measuring Instruments, Computer Hardware & Peripherals

Hardware Module multiplexes CAN interfaces.

July 20, 2012

Designed as hat rail module, Hub4x enables simultaneous information exchange with several units under test. Hardware provides both Master and Slave CAN, whereby master unit communicates with all Hub4x modules via connected Master CAN. Each module can be connected to UUT, resulting in 1:1 control. Via master unit, connected Hub4x modules can be configured with regard to routing and gateway functionalities. Additional I/O is provided for internal synchronization or control of triggered outputs. Read More

Test & Measuring Instruments

QorIQ Processor Libraries enable emulation testing.

June 28, 2012

Dedicated model libraries for Freescale QorIQ® processors of series 10xx, 20xx, and 30xx are available to support emulation technology VarioTAP®. Described as VarioTAP® models, libraries are structured modularly as intelligent IP as to enable complete fusion of Boundary Scan test and JTAG emulation. This technology enables users to verify and test hardware without specific firmware as well as program Flash memories. IP models are supported as standard beginning with SYSTEM CASCON(TM) v4.6. Read More

Computer Hardware & Peripherals

InLine Onboard Programmer handles non-volatile memory devices.

May 24, 2012

Based on SCANFLEX® architecture supporting Embedded System Access technologies, RAPIDO(TM) is designed for high-speed in-system programming of non-volatile memory devices such as Flash, serial EEPROM, MCUs, and PLDs. Model RPS900-S16 provides double-sided probing with up to 900 nail probes and gang programming of up to 16 sites. Supporting all ISP technologies based on embedded system access, solution features SYSTEM CASCON and SCANFLEX as its respective core software and hardware platforms. Read More

Test & Measuring Instruments

I/O Module is based on Xilinx FPGA.

May 15, 2012

ChipVORX® Module(TM) is controlled via standard TAP, enabling access to entire ChipVORX test and programming IPs for external instrumentation. Model FXT-X90, based on Xilinx FPGA, provides 90 I/O channels, 72 of which are voltage programmable. With transparent TAP, module enables daisy-chained cascading of several same or different boards types. Functions for universal frequency measurement, RAM test, Flash programming, or control of customer-specific instruments are provided as ChipVORX® IP. Read More

Software

Boundary Scan Development Software has multi-board capabilities.

April 4, 2012

For complex projects based on integrated system backplanes or motherboards with multi-slot interface, SYSTEM CASCON(TM) JTAG/Boundary Scan development Environment (v4.6 and onwards) integrates Board Merger. Tool generation supports completely project-oriented definition of multi-board target architecture, subsequently enabling automatic generation of consistent project database while maintaining original signal designations and board characteristics. Read More

Test & Measuring Instruments, Computer Hardware & Peripherals, Electrical Equipment & Systems

Interconnect Interface combines JTAG/Boundary Scan with PXI.

January 20, 2012

Available within frame of SCANFLEX® JTAG/Boundary Scan hardware platform, PXI 1149/DAK is compatible with SCOUT interconnect system from MAC Panel. As option for SFX/PXI1149/Cx-FXT and SFX/PXIe1149/Cx-FXT controller, PXI 1149/DAK2 version has differential test bus with 200 pin receiver and single-ended PIP resources. For SFX/PXI1149/Cx and SFX/PXIe1149/Cx controller, PXI 1149/DAK1 model features single-ended test bus with 96 pin receiver as well as single-ended PIP resources. Read More

Mechanical Components & Assemblies, Software

Modular IPs aid FPGA assisted test and measurement.

December 6, 2011

Consisting of modular IPs for control of chip-embedded instruments, ChipVORX® Model Libraries enable FPGA-assisted test of clock signals and measurement of frequencies directly in system application. Models also enable verification of impulses, indeterministic signal changes, or stuck-as O/1 faults. While control for automated production test is executed within framework of test program, graphic panels are also available for interactive debugging. Read More

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