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Latest New Product News from
GOEPEL electronics LLC

Electronic Components & Devices

FPGA Chips facilitate test and debug.

November 26, 2014

Available for Altera® System-on-Chips, VarioTAP® and ChipVORX® Chips combine FPGA logic with Hard Processor System in single package, serving as embedded instruments for test and programming of solutions they are fitted to. VarioTAP® uses native debug port to control test operations and programming functions via processor elements. ChipVORX® technology exploits capability of using FPGA embedded instruments in form of softcore IP in FPGA elements. Read More

Test & Measuring Instruments

Evaluation Board for CION LX facilitates test and development.

June 2, 2014

Designed to demonstrate technical test capabilities of CION LX JTAG controllable Tester on Chip (ToC), CION LX Evaluation Board (EVB) lets users verify all operating modes as well as develop applications and test scenarios. Circuit pins are accessible via connectors, and board also provides such additional resources as LEDs and adjustable clock generator up to 170 MHz. Control of features is carried out via JTAG port, and TAP connector allows direct access via Boundary Scan controllers. Read More

Test & Measuring Instruments, Computer Hardware & Peripherals

Interface Card supports boundary scan and processor emulation.

March 14, 2014

Available for SCANFLEX® Boundary Scan hardware platform, Model TIC122 features programmable multi-bus interface enabling nearly unlimited compatibility with standardized and proprietary microprocessor debug protocols and simultaneously supporting all Boundary Scan standards. Active test head is specifically developed for in-fixture utilization with adaptive streaming technology VarioTAP®. In addition to bus signals, it provides emulation signals that can be integrated in streaming procedure. Read More

Test & Measuring Instruments

Parallel Test and Programming Kit targets gang applications.

December 10, 2013

Offering complete solution for applications based on Embedded System Access (ESA) technologies, SFX Gang Test Module Kit may be used for parallel test and programming of up to 16 or 32 different assemblies with integrated Mass Interconnect Interface. Kit comprises 3 interconnected modules – TAP transceiver, multipurpose parallel I/O unit, and power management unit – that have onboard Mass Interconnect Interfaces and are centrally controlled. Read More

Test & Measuring Instruments, Machinery & Machining Tools

Inline Production System supports programming and board test.

December 9, 2013

Designed for in-system programming and board test based on Embedded System Access technologies, RAPIDO™ can utilize planar downholders in sandwich construction to safely handle ultra-thin, rigid-flexible boards with contact gaps up to 50 mil. All fixtures are equipped with intelligent module for identification and data storage, ensuring compatibility between fixture and target board. In addition, bandwidth, UUT, and test program can be automatically configured to avoid manual faults. Read More


IP Model Library fosters integration of Xilinx Kintex7 FPGAs.

November 6, 2013

Promoting ChipVORX® technology utilization, IP model library for Xilinx® Kintex7 FPGA family enables fully automatic usage of native design-integrated FPGA for execution of various at-speed test and programming tasks utilizing JTAG interface and special softcores. Without detailed FPGA knowledge, users can test DDR(x) memories, measure cycle frequencies, verify high-speed I/O by BERTs and eye diagram visualization, as well as program Flash memories at high speed. Read More

Software, Test & Measuring Instruments

Boundary Scan Test System handles complex projects.

July 17, 2013

Comprising hardware and software, SCANFLEX® Designer Studio is designed for test and debug tasks in complex projects in both design and production stages. Hardware is preconfigured for utilization of Embedded System Access technologies, and can be extended by additional I/O modules for further test and programming tasks. Offered in 3 versions, bundle's performance level may be upgraded from pure test to in-system programming of moderate Flash and PLDs, up to operations with layout visualization. Read More

Test & Measuring Instruments

JTAG Boundary Scan Tester features desktop form factor.

May 7, 2013

Combining all test electronics and basic mechanics, modular JULIET™ series supports all Embedded System Access (ESA) technologies for high-speed, in-system programming of Flash, PLD, and MCU as well as structural and functional at-speed board test. In addition to Boundary Scan, unit supports such test strategies as Processor Emulation and Chip Embedded Instruments respectively based on VarioTAP® and ChipVORX® technologies. Universal adaptors are supplied as standard. Read More

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GOEPEL electronics LLC