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Goepel Electronics, Ltd

9700 Great Hills Trail, Austin, TX, 78759, US

  • 888-446-3735

Stefan Meissner
GOEPEL electronic GmbH
Goeschwitzer Str. 58-60/66
Jena D-07745 Germany
Phone: +49-3641-6896-739
Fax: +49-3641-6896-944
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Latest New Product News from
Goepel Electronics, Ltd

Services, Software

Model Libraries aid MCU application testing and programming.

November 2, 2015

VarioTAP® model libraries, used for universal processor emulation, are available for Infineon XMC MCUs based on ARM® Cortex™-M cores. As part of IP library, VarioTAP model contains all relevant access information for respective target processor. This lets users select processor corresponding to their design and test/validate connected hardware unit as well as program Flash memories. Processor is reconfigured to provide design-integrated test and programming instruments via native debug port. Read More

Services, Test & Measuring Instruments

X-Ray Inspection System offers speed upgrade.

September 28, 2015

Designed for testing double-sided boards, X40 PLUS captures both top and bottom sides within single pass. With real-time multi-angle image, system can record complete 3D inspection of assembly. Integrated reconstruction methods based on digital thomosynthesis enable defined evaluation of individual layers of board. With upgrade, system offers inspection speed increase of 18%. Assembly measuring 216 x 164 mm with more than 8,000 solder joints requires 40 sec for complete 3D X-ray inspection. Read More

Test & Measuring Instruments

Mixed Signal I/O Module optimizes testability of assemblies.

April 24, 2015

With total of 96 single ended channels, Model SFX-5296LX extends Boundary Scan test to non-scannable components such as connectors, clusters, or analog interfaces. Unit uses parallel I/O and is equipped with diverse dynamic test resources for each channel, such as frequency counter, event detector, arbitrary waveform generator, and digitizer. Each channel can be configured as input, output, and tri-state, and both static and dynamic at-speed tests are feasible. Read More

Computer Hardware & Peripherals

Boundary Scan TAP Transceiver provides secure data transfer.

April 1, 2015

Using 16 parallel test access ports, SCANFLEX TAP Transceiver enables testing and programming of multiple units under test. Rack-mountable 19 in. Model SFX-TAP16/G-RM-FXT serves as system interface to UUT and is controlled by central SCANFLEX controller. With external test heads, unit offers secure signal transmission at distances up to 4 m. Transceiver supports all Embedded System Access, enabling production test, flash programming, and PLD to be executed without needles or probes. Read More

Test & Measuring Instruments

Demo Board detects integration-specific faults, wiring errors.

February 12, 2015

With hardware module that contains various Boundary Scan structures as well as non-Boundary Scan components, Integra V1 is intended for demonstrating integration solutions with such test methods as functional test, in-circuit test, manufacturing defects analyzer, and flying probe test. Production faults can be simulated by switch, signal states can be monitored, and additional test points allow testing of non-scannable partitions. Concurrently, module can also qualify integration. Read More


BERT Software supports PCI Express compatible bus systems.

October 30, 2014

Available as option, automated Bit Error Rate Test (BERT) solution enables FPGA Embedded Instruments utilization in form of softcores for test and design validation of PCI Express x1/x4/x8/x16 interfaces according to PCIe 1.0/2.0/3.0. To support design validation, graphical evaluation by eye diagram is possible. Relevant parameters for validation, such as pre-emphasis and equalizing, are interactively adjustable and become immediately effective without recompiling IP. Read More

Test & Measuring Instruments

Emulation Technology supports TI TMS570LSxx processor compatibility.

August 5, 2014

VarioTAP® technology, used for universal processor emulation, is available for Texas Instruments TMS570LSxx models of Hercules™ series. Processor is configured to provide design-integrated test and programming instruments via native debug port. As part of IP library, VarioTAP® model contains all relevant access information for respective target processor. Users can, due to this, select processor and then test and validate connected hardware units and program Flash memories. Read More

Test & Measuring Instruments

Universal Processor Emulation is available for TI AM355x series.

July 17, 2014

VarioTAP® technology is available for universal processor emulation for Texas Instruments AM355x products of Sitara™ series. Configuration provides design-integrated test and programming instruments via native debug port. Respective VarioTAP® model, as part of IP library, contains all relevant access information for respective target processor. Users can select processor corresponding to their design and then test and validate connected hardware unit as well as program Flash memories. Read More

Test & Measuring Instruments, Software

3D Inspection System is capable of sintering paste evaluation.

July 16, 2014

With hardware and software adaptions, SPI-LINE 3D electronic solder paste inspection system handles inspection of printed sintering paste in electronic assemblies manufacturing. High-speed 3D camera head can capture thin sintering paste layers with precision, while integrated algorithms enable evaluation of sintered paste printing in addition to accurate and rapid measurement of height, volume, and offset of applied sintering paste. UI also facilitates test program generation. Read More


ISP Flash Program Generator conserves time and effort.

July 9, 2014

Supporting all ISP (In-System Programming) options, Automated Flash Program Generator (AFPG) automatically generates scripts for universal ISP of non-volatile memory, such as flash devices, and MCUs with integrated flash via boundary scan. Mounted devices are programmed in native environment instead of as individual components before assembly. Tool provides graphical definition of command sequence, possibilities for bad block handling, multi-site support, and corresponding block library. Read More

Test & Measuring Instruments

Boundary Scan Module facilitates DDR3-DIMM socket testing.

July 1, 2014

Once plugged into test socket, CION Module SO-DIMM204-3/ECC allows structural test coverage of DDR3 memory interfaces. All signal pins, as well as almost all Ground-Pins, can be tested via Boundary Scan. Equipped with CION™ Boundary Scan ASIC, module can be connected to any Test Access Point (TAP) and lets user detect link failures. Tests take fractions of seconds, and even parallel testing of multiple memory interfaces is possible. Read More


Embedded Instruments automate differential clock signal test.

April 1, 2014

Used for universal frequency measurement based on FPGA soft macros, ChipVORX® models consist of modular IP capable of controlling chip embedded instruments. Products allow FPGA-assisted testing of differential clock signals as well as measurement of frequencies directly inside system application. This lets user verify dynamics of signals and increase test coverage, where workflow is fully automated by software. Counter function is also available. Read More


Validation/Test Platform supports Intel® Quark SoCs.

March 14, 2014

SYSTEM CASCON™ supports Intel® Quark SoCs based on utilization of native debug ports as control interface for platform debugging, electric validation, and production tests. This lets Intel Quark-centric boards with limited physical access and high speed signals be tested structurally and functionally. Integrated SDE offers tool suite, GUI, and graphical project development for synergistic utilization of all ESA technologies, enabling use without nail or probe access (non-invasive). Read More

Test & Measuring Instruments

FPGA Embedded Instruments support multi-channel BERT.

March 14, 2014

Offering IP-based technology for implementation, access, and control of chip embedded instruments via IEEE Std. 1149.x/JTAG, ChipVORX® also supports FPGA embedded instruments in form of softcores. System takes over complete process flow, including Target FPGA programming, IP to pin configuration, instrument control, data processing, and final IP unloading. Users can evaluate transmission channel quality via parallel measurement of bit error rate on all channels simultaneously. Read More


IDE Software supports 4th Gen Intel® Core(TM) processors.

August 7, 2013

With comprehensive tool suite and graphical project development for synchronized utilization of ESA technologies, SYSTEM CASCON™ provides validation and test of complex processor boards. Integrated software development environment enables test, programming, and debug operations without nail or probe access. In addition to JTAG/Boundary Scan/ IEEE 1149.x, key elements of ESA philosophy are Processor Emulation Test, Chip Embedded Instrumentation, Core Assisted Programming, and FPGA Assisted Test. Read More

Computer Hardware & Peripherals

Frame Grabber tests video data in infotainment systems.

June 14, 2013

Featuring modular architecture, Video Dragon tests high-speed LVDS connections and HDMI interfaces. When utilized as frame grabber, device records and analyzes single images and video sequences in raw-data format or as compressed files. Frame rate includes up to 60 images/sec at max color depth of 24 bits. Utilizing serializer in module port, Video Dragon turns into frame generator that may generate and transmit single images, image sequences, and video streams to target device to be tested. Read More

Test & Measuring Instruments, Computer Hardware & Peripherals

TAP Transceiver provides 16 parallel test access ports.

February 27, 2013

Featuring integrated power supply, 19 in. rackmount SFX-TAP16/G-RM is designed for testing and programming of up to 16 electronic assemblies in parallel. Architecture supports Embedded System Access technologies, including boundary scan, processor emulation, and chip-embedded instrumentation, enabling basic paradigm change without mechanical probe access. SCANFLEX module was developed specifically for gang applications, whereby various test and programming strategies can be combined. Read More

Test & Measuring Instruments, Software

Boundary Scan Test System targets entry level users.

February 27, 2013

In addition to Mixed Signal I/O module, PicoTAP Designer Studio includes PicoTAP Boundary Scan controller, which is powered via USB and can be plugged directly into I/O module. Hardware/software bundle also contains CION Module FXT-96/A and SYSTEM CASCON™ Basic/SX Development Station. Performance level can be extended from pure test in base version to additional applications such as in-system programming of small Flash and PLD or memory and cluster test. Read More

Test & Measuring Instruments

Inline Production System combines programming, test strategies.

December 12, 2012

For high-speed programming as well as board test, RAPIDO™ RPS3000-(x) models are based on Embedded System Access (ESA) technologies and support double-sided probing for up to 3,000 nails. Non-volatile memories – Flash, MCUs, PLDs – can be on-board programmed, and SCANFLEX® architecture with Short Wire Interface for up to 32 sites makes it is possible to combine programming tasks with test strategies such as Boundary Scan, Processor Emulation, Chip Embedded Instruments, or Functional Test. Read More

Test & Measuring Instruments

AOI System inspects THT components and solder joints.

December 7, 2012

Enabled by integration before wave soldering oven, OptiCon THT-Line enables parallel inspection of mounted components before soldering processes as well as PCB solder joints during return transport in THT production line. Camera system with focal range up to 80 mm inspects PCB component side, enabling detected faults to be rectified before soldering process. For solder joint inspection, scanner system integrated into lower transport area checks PCBs during return transport. Read More

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Goepel Electronics, Ltd