Nikon Metrology Inc.
Brighton, MI 48116
Latest CNC Video Measuring System Comes with Enhanced Through-The-Lens Laser Auto Focus
Offers stage control technology and image processing algorithm to achieve faster movements and image capture steps. Detects feature edges at very high speed, capturing accurately and automatically the shape and dimensions. Ideal for inspecting wide variety of mechanical, electrical, electronic, moulded, cast and pressed components.
Read More »Latest CNC Video Measuring System Comes with Enhanced Through-The-Lens Laser Auto Focus
Offers stage control technology and image processing algorithm to achieve faster movements and image capture steps. Detects feature edges at very high speed, capturing accurately and automatically the shape and dimensions. Ideal for inspecting wide variety of mechanical, electrical, electronic, moulded, cast and pressed components.
Read More »New ASTM E2737 Detector Evaluation Package Offers Automated Analysis of Image Data
Available with pre-calibrated artefact and simple-to-install customised bracketry with fast-change adapters. Long-term performance and stability of the detector can be tracked throughout its service life. Suitable for X-ray CT inspection, metrology and large envelope CT systems.
Read More »New ASTM E2737 Detector Evaluation Package Offers Automated Analysis of Image Data
Available with pre-calibrated artefact and simple-to-install customised bracketry with fast-change adapters. Long-term performance and stability of the detector can be tracked throughout its service life. Suitable for X-ray CT inspection, metrology and large envelope CT systems.
Read More »White Light Interferometric Microscope can measure graphene.
Comprising industrial, research-grade microscopes based on double beam interferometry objectives, BW series- combine white light interferometry (WLI) with standard optical techniques such as bright-field, dark-field, polarised light, DIC (differential interference contrast), and epifluorescence. Focus variation with WLIÂ offers effective height resolution of 15 pm and precise and accurate 3D...
Read More »White Light Interferometric Microscope can measure graphene.
Comprising industrial, research-grade microscopes based on double beam interferometry objectives, BW seriesÃ- combine white light interferometry (WLI) with standard optical techniques such as bright-field, dark-field, polarised light, DIC (differential interference contrast), and epifluorescence. Focus variation with WLIÃÂ offers effective height resolution of 15 pm and precise and...
Read More »High-Voltage Microfocus CT System inspects large, dense parts.
Used for measurement- as well as non-destructive testing and inspection, XT H 450 employs 450 kV microfocus source and is available with flat panel or curved linear diode array (CLDA) detector. Source's open-tube design with user-replaceable filaments offers virtually unlimited lifetime with minimal maintenance, and spot size ranges from 50–320 µm (depending on power). Walk-in cabinet...
Read More »High-Voltage Microfocus CT System inspects large, dense parts.
Used for measurementÃ- as well asànon-destructive testing and inspection, XT H 450 employs 450 kV microfocus source and is available withàflat panel or curved linear diode array (CLDA) detector. Source's open-tube design with user-replaceable filaments offers virtually unlimited lifetime with minimal maintenance, and spot size ranges from 50–320 õm (depending on power)....
Read More »CNC Video Measuring Systems utilize precise edge detection.
Utilizing optical measuring technology and image processing, NEXIV VMZ-R3020 and VMZ-R6555 automatically capture dimensions and shapes of components. NEXIV VMZ-R3020 is suitable for inspection of small components used for mechanical/electric applications, while NEXIV VMZ-R6555, featuring 65 x 55 cm measuring platform, targets larger PCBs or mechanical parts. Third ring illumination angle offers...
Read More »CNC Video Measuring Systems utilize precise edge detection.
Utilizing optical measuring technology and image processing, NEXIV VMZ-R3020 and VMZ-R6555 automatically capture dimensions and shapes of components. NEXIV VMZ-R3020 is suitable for inspection of small components used for mechanical/electric applications, while NEXIV VMZ-R6555, featuring 65 x 55 cm measuring platform, targets larger PCBs or mechanical parts. Third ring illumination angle offers...
Read More »Latest CNC Video Measuring System Comes with Enhanced Through-The-Lens Laser Auto Focus
Offers stage control technology and image processing algorithm to achieve faster movements and image capture steps. Detects feature edges at very high speed, capturing accurately and automatically the shape and dimensions. Ideal for inspecting wide variety of mechanical, electrical, electronic, moulded, cast and pressed components.
Read More »Latest CNC Video Measuring System Comes with Enhanced Through-The-Lens Laser Auto Focus
Offers stage control technology and image processing algorithm to achieve faster movements and image capture steps. Detects feature edges at very high speed, capturing accurately and automatically the shape and dimensions. Ideal for inspecting wide variety of mechanical, electrical, electronic, moulded, cast and pressed components.
Read More »New ASTM E2737 Detector Evaluation Package Offers Automated Analysis of Image Data
Available with pre-calibrated artefact and simple-to-install customised bracketry with fast-change adapters. Long-term performance and stability of the detector can be tracked throughout its service life. Suitable for X-ray CT inspection, metrology and large envelope CT systems.
Read More »New ASTM E2737 Detector Evaluation Package Offers Automated Analysis of Image Data
Available with pre-calibrated artefact and simple-to-install customised bracketry with fast-change adapters. Long-term performance and stability of the detector can be tracked throughout its service life. Suitable for X-ray CT inspection, metrology and large envelope CT systems.
Read More »Nikon Metrology & NSI Announce Partnership
Brighton, Michigan -- Nikon Metrology today announces a new partnership with NSI Microscopy Inspection Automation of Wexford, Ireland. This agreement will help customers with Continuous Process Improvement by making use of automated microscopy. NSI is a leader in the field of Continuous Process Improvement by using Automated Microscopy Software. The company specializes in medical device,...
Read More »Nikon Metrology & NSI Announce Partnership
Brighton, Michigan -- Nikon Metrology today announces a new partnership with NSI Microscopy Inspection Automation of Wexford, Ireland. This agreement will help customers with Continuous Process Improvement by making use of automated microscopy. NSI is a leader in the field of Continuous Process Improvement by using Automated Microscopy Software. The company specializes in medical device,...
Read More »WENZEL and Nikon Metrology Enter Distribution Partnership
The distribution agreement between Nikon Metrology, Inc. – Americas and WENZEL America sees two of the biggest global players for metrology create a new partnership in North America. This distribution partnership provides customers with the ultimate combination of innovative CMMs, with Nikon Metrology’s unequalled laser scanning technology. Nikon Metrology, Inc and WENZEL America announce...
Read More »WENZEL and Nikon Metrology Enter Distribution Partnership
The distribution agreement between Nikon Metrology, Inc. – Americas and WENZEL America sees two of the biggest global players for metrology create a new partnership in North America. This distribution partnership provides customers with the ultimate combination of innovative CMMs, with Nikon Metrology’s unequalled laser scanning technology. Nikon Metrology, Inc and WENZEL America announce...
Read More »White Light Interferometric Microscope can measure graphene.
Comprising industrial, research-grade microscopes based on double beam interferometry objectives, BW series- combine white light interferometry (WLI) with standard optical techniques such as bright-field, dark-field, polarised light, DIC (differential interference contrast), and epifluorescence. Focus variation with WLIÂ offers effective height resolution of 15 pm and precise and accurate 3D...
Read More »White Light Interferometric Microscope can measure graphene.
Comprising industrial, research-grade microscopes based on double beam interferometry objectives, BW seriesÃ- combine white light interferometry (WLI) with standard optical techniques such as bright-field, dark-field, polarised light, DIC (differential interference contrast), and epifluorescence. Focus variation with WLIÃÂ offers effective height resolution of 15 pm and precise and...
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