Asylum Research
Santa Barbara, CA 93117
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Atomic Force Microscopes sense both resistance and capacitance.
Based on shielded AFM probes and electronics from PrimeNano, Inc., sMIM Scanning Microwave Impedance Microscopy is integrated exclusively with MFP-3D™ and Cypher™ AFMs.Ã- Technique enables nanoscale mapping of permittivity and conductivity on linear and non-linear materials, including conductors, semiconductors, and insulators. sMIM is applicable to broad range of samples, including...
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Asylum Research Introduces Electrochemical Strain Microscopy for Energy Storage Research
(Santa Barbara, CA): Asylum Research, the technology leader in Scanning Probe and Atomic Force Microscopy (SPM/AFM), has announced the new Electrochemical Strain Microscopy (ESM) imaging technique for its Cypher(TM) and MFP-3D(TM) AFMs. Developed by Oak Ridge National Laboratory (ORNL) and Asylum Research, ESM is an innovative scanning probe microscopy (SPM) technique capable of probing...
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Asylum Research's MFP NanoIndenter Wins AVS Product Award
January 8, 2009 (Santa Barbara, CA): AVS and Asylum Research have announced that Asylum's MFP-3D(TM) NanoIndenter has been selected as one of the top five products exhibited at the AVS International Symposium in October. Asylum's MFP NanoIndenter is a true instrumented indenter and is the first AFM-based indenter that does not use cantilevers as part of the indenting mechanism. These...
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Atomic Force Microscope uses nanoindenter module.
Available in Standard and Low Force models, NanoIndenter fits on MFP-3D AFM System head for viewing of sample, and drives nanoindenting tip perpendicular to sample. Tip displacement and force are measured with microscope's optical detector and NPS(TM) Nanopositioning sensors, allowing repeatable imaging, quantitative feature measurement, accurate imaging offsets, quantitative force curves, and...
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Module aids in taking conductive AFM measurements.
Working with MFP-3D(TM) AFM System, ORCA(TM) enables current measurements in range of hundreds of femtoamps to nearly 1 microamp. Module consists of cantilever holder that includes transimpedance amplifier. User can choose gain of amplifier, and standard values range from 5 x 107 to 5 x 109 V/A. Module is suited for characterizing dielectric and ferro-electric films, nanotubes, or conductive...
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AFM System offers nanolithography and manipulation feature.
MFP-3DÃ-® AFM System consists of digital controller, Igor Pro software, and Nanopositioning system. With MicroAngelo feature, system allows nanolithography images to be imported from other programs or generated within software environment. Imported images are converted into series of contour lines which are then scaled and used to drive scanner to create lithographic image. Sensored, closed...
Read More »Upcoming Asylum Research Webinar âProbing Nanoscale Structure & Properties of Polymers: Advances in Atomic Force Microscopy,â October 16, 2019
October 1, 2019 (Santa Barbara, CA) Oxford Instruments Asylum Research, in partnership with SelectScience, will be hosting a free webinar titled “Probing Nanoscale Structure & Properties of Polymers: Advances in Atomic Force Microscopy” on October 16th. Polymer science is a very active and vibrant field for research and development, both commercially and in academia. Material and product...
Read More »Asylum Research Quantifies the âLast Axisâ in Atomic Force Microscopy
February 8, 2018 (Santa Barbara, CA) - Oxford Instruments Asylum Research announces their development of an interferometric displacement sensor (IDS) that provides a direct measure of AFM cantilever displacement. The IDS interfaces the existing optical system of the Asylum Research Cypher AFM with an external laser Doppler vibrometer. It does not replace the standard laser and detector; rather,...
Read More »New Application Note Describes Electrochemical Atomic Force Microscopy for Understanding Corrosion Mechanisms at the Nanoscale
January 30, 2018 (Santa Barbara, CA) - Combining an atomic force microscope (AFM) with electrochemical capabilities creates a powerful tool for studying corrosion, oxidation, and mass transfer of metals at the nanoscale. The new application note “Exploring Corrosion with Electrochemical AFM” from Oxford Instruments Asylum Research discusses how AFM can be used to study the nanoscale evolution...
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Atomic Force Microscopes sense both resistance and capacitance.
Based on shielded AFM probes and electronics from PrimeNano, Inc., sMIM Scanning Microwave Impedance Microscopy is integrated exclusively with MFP-3D™ and Cypher™ AFMs.Ã- Technique enables nanoscale mapping of permittivity and conductivity on linear and non-linear materials, including conductors, semiconductors, and insulators. sMIM is applicable to broad range of samples, including...
Read More »
Asylum Research Introduces Electrochemical Strain Microscopy for Energy Storage Research
(Santa Barbara, CA): Asylum Research, the technology leader in Scanning Probe and Atomic Force Microscopy (SPM/AFM), has announced the new Electrochemical Strain Microscopy (ESM) imaging technique for its Cypher(TM) and MFP-3D(TM) AFMs. Developed by Oak Ridge National Laboratory (ORNL) and Asylum Research, ESM is an innovative scanning probe microscopy (SPM) technique capable of probing...
Read More »Asylum Research Presents Cypher(TM) UCLA-CNSI Scan Tour/Workshop April 19-21, 2011
March 7, 2011 (Santa Barbara, CA): Asylum Research, the technology leader in scanning probe and atomic force microscopy (SPM/AFM), announces the Cypher AFM Scan Tour and Workshop will take place at the UCLA-CNSI's Nano and Pico Characterization Laboratory on April 19-21, 2011. Each day's agenda will include a presentation of Cypher's unique features and allow attendees to look inside the box and...
Read More »Asylum Research Presents Cypher(TM) United Kingdom and Ireland Scan Tour for Spring 2011
March 3, 2011 (Santa Barbara, CA): Asylum Research, the technology leader in scanning probe and atomic force microscopy (SPM/AFM), announces the continuation of the Cypher AFM Scan Tour that will take place at the University of Southampton, March 29-31, and University College Dublin, April 5-7. Each day's agenda will include a presentation of Cypher's unique features and allow attendees to look...
Read More »New Scanning Probe Microscopy Book Features Articles by Asylum Research Scientists and Customers
February 22, 2011 (Santa Barbara, CA): The new book, Scanning Probe Microscopy of Functional Materials, edited by Dr. Sergei Kalinin of the Oak Ridge National Laboratory and Alexei Gruverman of the University of Nebraska, describes cutting-edge nanoscale imaging and spectroscopy advances in the field of atomic force/scanning probe microscopy. The volume includes 18 articles by leading university,...
Read More »Max Planck Institute and Asylum Research Organize 2nd International Workshop for Scanning Probe Microscopy for Energy Applications
February 17, 2011 (Santa Barbara, CA): The Max Planck Institute for Polymer Research (MPI-P) and Asylum Research, the technology leader in scanning probe/atomic force microscopy (SPM/AFM), are co-organizing the 2nd International Workshop for Scanning Probe Microscopy for Energy Applications, to be held at the MPI-P in Mainz, Germany from June 8-10, 2011. Following the highly successful first...
Read More »Asylum Research Offers AFM in Biology Class April 13-15, 2011
February 11, 2011 (Santa Barbara, CA), Asylum Research, the technology leader in scanning probe/atomic force microscopy (AFM/SPM) announces its AFM in Biology Class to be held April 13-15, 2011 in Santa Barbara, California. The class is open to all Atomic Force Microscopy users that want to increase their knowledge of AFM in biology and life sciences. A high resolution imaging lab on the...
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