Ambios Technology Inc.
Santa Cruz, CA 95060
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System characterizes surface morphology at nanoscale.
Suited for surface measurement and analysis, Model AFP-200 includes atomic force microscope, which permits atomic scale resolution over fields of view from 10's of nanometers to 80 microns in X and Y. System's interferometer operates like traditional optical microscope with nanometer resolution in Z over fields of view from 100 x 100 microns to 2.0 x 2.0 mm. Stylus profilometer can operate in...
Read More »System characterizes surface morphology at nanoscale.
Suited for surface measurement and analysis, Model AFP-200 includes atomic force microscope, which permits atomic scale resolution over fields of view from 10's of nanometers to 80 microns in X and Y. System's interferometer operates like traditional optical microscope with nanometer resolution in Z over fields of view from 100 x 100 microns to 2.0 x 2.0 mm. Stylus profilometer can operate in...
Read More »Interferometer/SPM Unit enhances surface imaging, metrology.
Offered as fully integrated solution, Q-View White Light Interferometer/SPM system combines benefits of white light interferometry and SPM technologies. Q-View Interferometric Module integrates seamlessly onto Q-Scope SPM platform. It uses optical profiler technology to render and measure areas as large as 500 -µm within seconds. Users can switch to SPM mode and characterize surface structures...
Read More »Interferometer/SPM Unit enhances surface imaging, metrology.
Offered as fully integrated solution, Q-View White Light Interferometer/SPM system combines benefits of white light interferometry and SPM technologies. Q-View Interferometric Module integrates seamlessly onto Q-Scope SPM platform. It uses optical profiler technology to render and measure areas as large as 500 Ã-µm within seconds. Users can switch to SPM mode and characterize surface...
Read More »Ambios Technology Introduces New Surface Profilometer Product Line
SANTA CRUZ, CA - October 17, 2007 - Ambios Technology, Inc. introduced its new family of surface profilometers at the 54th annual American Vacuum Society conference in Seattle. The XP-Plus Series Profilers feature entirely new control electronics, software, and substantially improved performance specifications. The series consists of three different profilers, each designed to meet the diverse...
Read More »Ambios Technology Introduces New Surface Profilometer Product Line
SANTA CRUZ, CA - October 17, 2007 - Ambios Technology, Inc. introduced its new family of surface profilometers at the 54th annual American Vacuum Society conference in Seattle. The XP-Plus Series Profilers feature entirely new control electronics, software, and substantially improved performance specifications. The series consists of three different profilers, each designed to meet the diverse...
Read More »System characterizes surface morphology at nanoscale.
Suited for surface measurement and analysis, Model AFP-200 includes atomic force microscope, which permits atomic scale resolution over fields of view from 10's of nanometers to 80 microns in X and Y. System's interferometer operates like traditional optical microscope with nanometer resolution in Z over fields of view from 100 x 100 microns to 2.0 x 2.0 mm. Stylus profilometer can operate in...
Read More »System characterizes surface morphology at nanoscale.
Suited for surface measurement and analysis, Model AFP-200 includes atomic force microscope, which permits atomic scale resolution over fields of view from 10's of nanometers to 80 microns in X and Y. System's interferometer operates like traditional optical microscope with nanometer resolution in Z over fields of view from 100 x 100 microns to 2.0 x 2.0 mm. Stylus profilometer can operate in...
Read More »Interferometer/SPM Unit enhances surface imaging, metrology.
Offered as fully integrated solution, Q-View White Light Interferometer/SPM system combines benefits of white light interferometry and SPM technologies. Q-View Interferometric Module integrates seamlessly onto Q-Scope SPM platform. It uses optical profiler technology to render and measure areas as large as 500 -µm within seconds. Users can switch to SPM mode and characterize surface structures...
Read More »Interferometer/SPM Unit enhances surface imaging, metrology.
Offered as fully integrated solution, Q-View White Light Interferometer/SPM system combines benefits of white light interferometry and SPM technologies. Q-View Interferometric Module integrates seamlessly onto Q-Scope SPM platform. It uses optical profiler technology to render and measure areas as large as 500 Ã-µm within seconds. Users can switch to SPM mode and characterize surface...
Read More »Ambios Technology Introduces New Surface Profilometer Product Line
SANTA CRUZ, CA - October 17, 2007 - Ambios Technology, Inc. introduced its new family of surface profilometers at the 54th annual American Vacuum Society conference in Seattle. The XP-Plus Series Profilers feature entirely new control electronics, software, and substantially improved performance specifications. The series consists of three different profilers, each designed to meet the diverse...
Read More »Ambios Technology Introduces New Surface Profilometer Product Line
SANTA CRUZ, CA - October 17, 2007 - Ambios Technology, Inc. introduced its new family of surface profilometers at the 54th annual American Vacuum Society conference in Seattle. The XP-Plus Series Profilers feature entirely new control electronics, software, and substantially improved performance specifications. The series consists of three different profilers, each designed to meet the diverse...
Read More »