Ambios Technology Inc.

System characterizes surface morphology at nanoscale.
Optics & Photonics

System characterizes surface morphology at nanoscale.

Suited for surface measurement and analysis, Model AFP-200 includes atomic force microscope, which permits atomic scale resolution over fields of view from 10's of nanometers to 80 microns in X and Y. System's interferometer operates like traditional optical microscope with nanometer resolution in Z over fields of view from 100 x 100 microns to 2.0 x 2.0 mm. Stylus profilometer can operate in...

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System characterizes surface morphology at nanoscale.
Optics & Photonics

System characterizes surface morphology at nanoscale.

Suited for surface measurement and analysis, Model AFP-200 includes atomic force microscope, which permits atomic scale resolution over fields of view from 10's of nanometers to 80 microns in X and Y. System's interferometer operates like traditional optical microscope with nanometer resolution in Z over fields of view from 100 x 100 microns to 2.0 x 2.0 mm. Stylus profilometer can operate in...

Read More »
Controls & Controllers

Interferometer/SPM Unit enhances surface imaging, metrology.

Offered as fully integrated solution, Q-View White Light Interferometer/SPM system combines benefits of white light interferometry and SPM technologies. Q-View Interferometric Module integrates seamlessly onto Q-Scope SPM platform. It uses optical profiler technology to render and measure areas as large as 500 -µm within seconds. Users can switch to SPM mode and characterize surface structures...

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Controls & Controllers

Interferometer/SPM Unit enhances surface imaging, metrology.

Offered as fully integrated solution, Q-View White Light Interferometer/SPM system combines benefits of white light interferometry and SPM technologies. Q-View Interferometric Module integrates seamlessly onto Q-Scope SPM platform. It uses optical profiler technology to render and measure areas as large as 500 Â-µm within seconds. Users can switch to SPM mode and characterize surface...

Read More »
Controls & Controllers

Ambios Technology Introduces New Surface Profilometer Product Line

SANTA CRUZ, CA - October 17, 2007 - Ambios Technology, Inc. introduced its new family of surface profilometers at the 54th annual American Vacuum Society conference in Seattle. The XP-Plus Series Profilers feature entirely new control electronics, software, and substantially improved performance specifications. The series consists of three different profilers, each designed to meet the diverse...

Read More »
Controls & Controllers

Ambios Technology Introduces New Surface Profilometer Product Line

SANTA CRUZ, CA - October 17, 2007 - Ambios Technology, Inc. introduced its new family of surface profilometers at the 54th annual American Vacuum Society conference in Seattle. The XP-Plus Series Profilers feature entirely new control electronics, software, and substantially improved performance specifications. The series consists of three different profilers, each designed to meet the diverse...

Read More »
System characterizes surface morphology at nanoscale.
Optics & Photonics

System characterizes surface morphology at nanoscale.

Suited for surface measurement and analysis, Model AFP-200 includes atomic force microscope, which permits atomic scale resolution over fields of view from 10's of nanometers to 80 microns in X and Y. System's interferometer operates like traditional optical microscope with nanometer resolution in Z over fields of view from 100 x 100 microns to 2.0 x 2.0 mm. Stylus profilometer can operate in...

Read More »
System characterizes surface morphology at nanoscale.
Optics & Photonics

System characterizes surface morphology at nanoscale.

Suited for surface measurement and analysis, Model AFP-200 includes atomic force microscope, which permits atomic scale resolution over fields of view from 10's of nanometers to 80 microns in X and Y. System's interferometer operates like traditional optical microscope with nanometer resolution in Z over fields of view from 100 x 100 microns to 2.0 x 2.0 mm. Stylus profilometer can operate in...

Read More »
Controls & Controllers

Interferometer/SPM Unit enhances surface imaging, metrology.

Offered as fully integrated solution, Q-View White Light Interferometer/SPM system combines benefits of white light interferometry and SPM technologies. Q-View Interferometric Module integrates seamlessly onto Q-Scope SPM platform. It uses optical profiler technology to render and measure areas as large as 500 -µm within seconds. Users can switch to SPM mode and characterize surface structures...

Read More »
Controls & Controllers

Interferometer/SPM Unit enhances surface imaging, metrology.

Offered as fully integrated solution, Q-View White Light Interferometer/SPM system combines benefits of white light interferometry and SPM technologies. Q-View Interferometric Module integrates seamlessly onto Q-Scope SPM platform. It uses optical profiler technology to render and measure areas as large as 500 Â-µm within seconds. Users can switch to SPM mode and characterize surface...

Read More »
Controls & Controllers

Ambios Technology Introduces New Surface Profilometer Product Line

SANTA CRUZ, CA - October 17, 2007 - Ambios Technology, Inc. introduced its new family of surface profilometers at the 54th annual American Vacuum Society conference in Seattle. The XP-Plus Series Profilers feature entirely new control electronics, software, and substantially improved performance specifications. The series consists of three different profilers, each designed to meet the diverse...

Read More »
Controls & Controllers

Ambios Technology Introduces New Surface Profilometer Product Line

SANTA CRUZ, CA - October 17, 2007 - Ambios Technology, Inc. introduced its new family of surface profilometers at the 54th annual American Vacuum Society conference in Seattle. The XP-Plus Series Profilers feature entirely new control electronics, software, and substantially improved performance specifications. The series consists of three different profilers, each designed to meet the diverse...

Read More »

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