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Corelis, Inc.

13100 Alondra Blvd., Cerritos, CA, 90703, US

  • 888-808-2380
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Latest New Product News from
Corelis, Inc.


JTAG Starter Kit facilitates test and debug.

November 28, 2014

Combining advanced capabilities of ScanExpress Debugger with portable USB 2.0 JTAG controller, JTAG Starter Kit provides interactive, real-time visual control and observation of all boundary-scan controllable input and output signals. JTAG protocol command module enables direct, low-level access to JTAG scans, while optocode discovery module identifies potential undocumented instructions for each device on scan chain. TCK test automatically determines max clock rate for unit under test. Read More


Semiconductor Validation Application helps identify counterfeits.

June 25, 2014

JTAG Interrogator, targeted at receiving inspection and QA departments, aids validation of authentic semiconductors. Specifically, this software tool utilizes IEEE-1149.1 standard on-chip electronic identification techniques to help detect and report counterfeit semiconductors. Functionality facilitates process of electronically reading and verifying identification information from compatible JTAG components, including Electronic Chip ID (ECID) standardized under IEEE-1149.1-2013. Read More


Boundary-Scan Testing Software leverages several modules.

June 23, 2014

ScanExpress Boundary-Scan Tool Suite v8.0 includes ScanExpress Debugger interface with pin browser interface, script modules, and JTAG protocol scan module. Top-level ScanExpress TPG project, also included, features project revision and comparison wizards, support for netlist and BOM replacement, and was/is file support for back-annotation. Other features include ScanExpress JET with boot sequence recording and JET model management system that helps obtain CPU and peripheral updates. Read More

Test & Measuring Instruments, Software

I2C Bus Analyzers feature advanced triggering.

November 22, 2013

Available for BusPro-I and CAS-1000-I2C/E bus analyzers, I2C Exerciser v1.24 allows users to generate I2C traffic, non-intrusively monitor and record all I2C bus traffic, and display real-time data in both state and waveform timing windows—all concurrently using single instrument. Advanced multi-level trigger with graphical design interface helps isolate event sequences. It can trigger on I2C protocol conditions, such as transaction type, data or address value, and protocol errors. Read More

Test & Measuring Instruments, Vision Systems, Software

Boundary-Scan Suite offers cluster testing support.

May 2, 2013

Broadening structural and functional test capabilities, ScanExpress Boundary-Scan Tool Suite v7.8 features model-based test coverage, which limits test vector generation to nets where all nodes have been identified with device model. Cluster definitions are assignable by pin numbers in addition to net name. TPG parsing engine will automatically ignore leading P values found in pin definitions for non-BGA type BSDL files. In addition, v7.8 expands JET support to TI AM335x Sitara™ processors. Read More


Bus Analyzer Software features repeatable trigger conditions.

November 15, 2012

Designed to optimize capabilities of BusPro-I and CAS-1000-I2C/E bus analyzer products, I2C Exerciser v1.23 allows users to generate I2C traffic, non-intrusively listen to and record all I2C bus traffic, and display real-time data in both state and waveform timing windows—all concurrently using single instrument. Verified to run on Windows 8, software provides master and slave emulation, scripting language to control test sequences, and signal parametric measurements. Read More

Computer Hardware & Peripherals

Quad-SPI Host Adapter supports up to 200 Mbps throughput.

August 13, 2012

Featuring 60 MHz clock rates, USB-powered BusPro-S enables engineers to save development time by providing low level control of Serial Peripheral Interface buses for generation of SPI messages and programming SPI memory. Unit provides user selectable interface voltages down to 1.8 V; standard, dual, quad, and 3-wire mode support; and 8 independent slave select signals. BusPro-S is controlled by included SPI Exerciser software using two modules: Debugger and Programmer. Read More


Boundary Scan Tools expand structural, functional test abilities.

June 1, 2012

In addition to support for multi-core devices, ScanExpress Boundary-Scan Tool Suite v7.7 offers separate global and local constraint entry within ScanExpress TPG preparation GUI. Inverted transparency model support is provided along with constraint to identify inverted nets as well as ability to associate multiple BSDL files to single JTAG device. Solution further offers FlexNet network licensing for ScanExpress JET and NAND Flash bad block management support in ScanExpress JET. Read More

Test & Measuring Instruments

JTAG Solution is designed for Teradyne in-circuit testers.

April 16, 2012

Designed for use with Teradyne TestStation(TM) and GR228x series testers, QuadTAP/CFM integrates advanced boundary-scan test capabilities into Teradyne in-circuit testers. This 4-channel platform provides Advanced JTAG control using vacant slots on Teradyne Multi-Function Application Board, allowing up to 2 test access ports (TAPs) with single CFM slot or up to 4 TAPs using expander modules. TAP interface voltages are independently adjustable from 1.25-3.3 V. Read More


JTAG Testing Software supports Freescale i.MX51 processors.

November 22, 2011

Providing at-speed testing of embedded processor-based electronic PCB and systems, ScanExpress JET(TM) detects, isolates, and diagnoses structural and functional defects with minimal development. Program controls i.MX51's ARM Cortex(TM)-A8 core through JTAG debug port, enabling development and execution of binary and script test steps using graphical user interface on host PC. Standardized interface tests for SDRAM memory, I2C, Ethernet, PMIC, and UART. Read More

Test & Measuring Instruments

JTAG Test System supports AMD embedded processors.

October 27, 2011

Supporting Turion(TM) II Neo, Athlon(TM) II Neo, Opteron(TM) 4100, and Opteron(TM) Quad-Core processors, ScanExpress JET provides automated at-speed, non-intrusive functional testing for SDRAM memory, SPI Flash, I2C, and UART. System features HyperTransport(TM) link validation, peripheral detection of PCI and PCIe buses, and fully automatic test development for all supported peripherals. No boot code is required for test execution. Read More

Test & Measuring Instruments

JTAG Platform integrates boundary-scan test into in-circuit testers.

October 14, 2011

Integrating boundary-scan test patterns into Teradyne TestStation and GR228x series in-circuit testers (ICTs), USB-1149.1/CFM offers Teradyne users 100 MHz clock rate boundary-scan test support, JTAG test vector reusability across multiple manufacturing test stations, and testing of IEEE-1149.6 AC-coupled digital networks. Additional capabilities include in-system programming of Flash and CPLD devices, and automated boundary-scan test vector generation/execution. Read More


Boundary Scan Test Software automates test development.

April 18, 2011

ScanExpress Boundary-Scan Tool Suite v7.5 includes ScanExpress TPG, with automatic identification and classification of resistors and capacitors involved in IEEE-1149.6 high speed, AC-coupled, and differential circuits. Scripting functions such as SPI and I2C functions, GPIO control, 3rd-party program execution, and access to test session information are included. Supporting multiple ID codes/boundary-scan device, suite also offers ScanExpress JET support for ARM Cortex-M3 and Cortex-A8 cores. Read More


JTAG Test Solution accommodates all risk profiles.

November 23, 2010

Offered as service-oriented product based on ScanExpress software, TestGenie provides complete boundary-scan test procedure along with production-ready execution station. In addition to board specific perpetual licenses for ScanExpress Runner, ScanExpress ADO, and ScanExpress Viewer modules, platform includes USB JTAG controller, 12 month hardware and software support contract, and test procedure development for one unit under test. Read More

Test & Measuring Instruments, Computer Hardware & Peripherals, Electronic Components & Devices

Low-Voltage JTAG Adapter is designed for Intel processors.

August 12, 2010

Low Voltage Adapter provides electrical and mechanical interface to connect any Corelis 20-pin boundary-scan controller to high-density Intel XDP connector, enabling compatibility between controllers and JTAG designs operating below 2.5 V. Unit is rated to support up to 100 MHz TCK speeds, drives up to 90 mA on its outputs, and drives 50 W resistor at 1 V. It also employs ESD protection and supports Intel XDP, XDP-Sinned, and ITP700Flex connectors. Read More


JTAG Boundary-Scan Suite facilitates programming tasks.

March 10, 2010

With support for legacy and FlexNet licensing, ScanExpress Boundary-Scan Tool Suite v7.0 features file manipulation functions incorporated by TPG scripting engine as well as test pattern generation support for Firecron JTS06Bu 6-port JTAG gateway hierarchical device. In addition to optimized ScanExpress JET Flash programming speeds, solution offers support for 64-bit Flash address access and ScanExpress JET processor support for BCM7400, i.MX27, OMAP3530, and PPC603EV. Read More

Test & Measuring Instruments

Memory Testing Modules include DDR3 support.

August 24, 2009

ScanDIMM(TM) modules provide boundary-scan testability and complete fault isolation when testing DDR3 DIMM sockets. Insertion into DIMM socket of UUT results in placing bi-directional boundary-scan cell behind each pin of DIMM connector, increasing test coverage to include data and address signal pins as well as clock, control, power, and ground pins. Cell architecture enables test pattern generation tools to apply optimal diagnostic algorithms to isolate any failure under investigation. Read More

Test & Measuring Instruments, Software

I2C Bus Analyzer offers feature set to aid development.

February 13, 2009

BusPro I2C(TM) provides with intuitive environment for I²C hardware debugging, software development, and in-system programming. ISP capabilities facilitate programming and verification of I²C-compatible EEPROM devices with one-click interface to display and update memory contents. Also, software developers can monitor and log I²C bus traffic in real-time, and decoded I²C protocol is displayed to show bus transactions. I²C bit rates to 5 Mbps are supported. Read More

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