Company News

Corelis, Inc.

13100 Alondra Blvd., Cerritos, CA, 90703, US

  • 562-926-6727
  • 888-808-2380
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Latest New Product News from
Corelis, Inc.

Software

Semiconductor Validation Application helps identify counterfeits.

June 25, 2014

JTAG Interrogator, targeted at receiving inspection and QA departments, aids validation of authentic semiconductors. Specifically, this software tool utilizes IEEE-1149.1 standard on-chip electronic identification techniques to help detect and report counterfeit semiconductors. Functionality facilitates process of electronically reading and verifying identification information from compatible JTAG components, including Electronic Chip ID (ECID) standardized under IEEE-1149.1-2013. Read More

Software

Boundary-Scan Testing Software leverages several modules.

June 23, 2014

ScanExpress Boundary-Scan Tool Suite v8.0 includes ScanExpress Debugger interface with pin browser interface, script modules, and JTAG protocol scan module. Top-level ScanExpress TPG project, also included, features project revision and comparison wizards, support for netlist and BOM replacement, and was/is file support for back-annotation. Other features include ScanExpress JET with boot sequence recording and JET model management system that helps obtain CPU and peripheral updates. Read More

Software, Test & Measuring Instruments

I2C Bus Analyzers feature advanced triggering.

November 22, 2013

Available for BusPro-I and CAS-1000-I2C/E bus analyzers, I2C Exerciser v1.24 allows users to generate I2C traffic, non-intrusively monitor and record all I2C bus traffic, and display real-time data in both state and waveform timing windows—all concurrently using single instrument. Advanced multi-level trigger with graphical design interface helps isolate event sequences. It can trigger on I2C protocol conditions, such as transaction type, data or address value, and protocol errors. Read More

Software, Vision Systems, Test & Measuring Instruments

Boundary-Scan Suite offers cluster testing support.

May 2, 2013

Broadening structural and functional test capabilities, ScanExpress Boundary-Scan Tool Suite v7.8 features model-based test coverage, which limits test vector generation to nets where all nodes have been identified with device model. Cluster definitions are assignable by pin numbers in addition to net name. TPG parsing engine will automatically ignore leading P values found in pin definitions for non-BGA type BSDL files. In addition, v7.8 expands JET support to TI AM335x Sitara™ processors. Read More

Software

Bus Analyzer Software features repeatable trigger conditions.

November 15, 2012

Designed to optimize capabilities of BusPro-I and CAS-1000-I2C/E bus analyzer products, I2C Exerciser v1.23 allows users to generate I2C traffic, non-intrusively listen to and record all I2C bus traffic, and display real-time data in both state and waveform timing windows—all concurrently using single instrument. Verified to run on Windows 8, software provides master and slave emulation, scripting language to control test sequences, and signal parametric measurements. Read More

Computer Hardware & Peripherals

Quad-SPI Host Adapter supports up to 200 Mbps throughput.

August 13, 2012

Featuring 60 MHz clock rates, USB-powered BusPro-S enables engineers to save development time by providing low level control of Serial Peripheral Interface buses for generation of SPI messages and programming SPI memory. Unit provides user selectable interface voltages down to 1.8 V; standard, dual, quad, and 3-wire mode support; and 8 independent slave select signals. BusPro-S is controlled by included SPI Exerciser software using two modules: Debugger and Programmer. Read More

Software

Boundary Scan Tools expand structural, functional test abilities.

June 1, 2012

In addition to support for multi-core devices, ScanExpress Boundary-Scan Tool Suite v7.7 offers separate global and local constraint entry within ScanExpress TPG preparation GUI. Inverted transparency model support is provided along with constraint to identify inverted nets as well as ability to associate multiple BSDL files to single JTAG device. Solution further offers FlexNet network licensing for ScanExpress JET and NAND Flash bad block management support in ScanExpress JET. Read More

Test & Measuring Instruments

JTAG Solution is designed for Teradyne in-circuit testers.

April 16, 2012

Designed for use with Teradyne TestStation(TM) and GR228x series testers, QuadTAP/CFM integrates advanced boundary-scan test capabilities into Teradyne in-circuit testers. This 4-channel platform provides Advanced JTAG control using vacant slots on Teradyne Multi-Function Application Board, allowing up to 2 test access ports (TAPs) with single CFM slot or up to 4 TAPs using expander modules. TAP interface voltages are independently adjustable from 1.25-3.3 V. Read More

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Corelis, Inc.