Tektronix, Inc.
Beaverton, OR 97077
New Isolated Oscilloscope Probes Available in Bandwidths Ranging from 200 MHz to 1 GHz
Offers combination of high bandwidth, dynamic range and best-in-class CMRR over the probe's full bandwidth. Probes are more sensitive, with less noise at +/- 50V measurements for high visibility. Uses electro-optical technologies to capture signals and power the probes without the need for an electrical connection.
Read More »New Isolated Oscilloscope Probes Available in Bandwidths Ranging from 200 MHz to 1 GHz
Offers combination of high bandwidth, dynamic range and best-in-class CMRR over the probe's full bandwidth. Probes are more sensitive, with less noise at +/- 50V measurements for high visibility. Uses electro-optical technologies to capture signals and power the probes without the need for an electrical connection.
Read More »New S530 Series Parametric Test System Comes with Built-In Transient Over-Voltage / Over-Current Protection
Enables semiconductor fabs to add parametric test capacity for high-growth new technologies while minimizing CAPEX investment and maximizing wafers per hour efficiency. Enables testing up to 1100V on any pin to boost throughput by 50 percent or more over competitive systems in power and WBG applications. Offered with KTE 7 software that simplifies and speeds up the migration path and achieves...
Read More »New S530 Series Parametric Test System Comes with Built-In Transient Over-Voltage / Over-Current Protection
Enables semiconductor fabs to add parametric test capacity for high-growth new technologies while minimizing CAPEX investment and maximizing wafers per hour efficiency. Enables testing up to 1100V on any pin to boost throughput by 50 percent or more over competitive systems in power and WBG applications. Offered with KTE 7 software that simplifies and speeds up the migration path and achieves...
Read More »New 6 Series B Mixed Signal Oscilloscope Features TekVPI Probe Interface
Offers signal fidelity with12-bit ADCs and extremely low noise, 10 GHz bandwidth and up to 8 FlexChannel™ inputs. Comes with removable SSD with optional security licenses and enables use of the oscilloscope in secure environments by minimizing cybersecurity threats. Ideal for diverse applications in semiconductors, power integrity, automotive, defense, and aerospace.
Read More »New 6 Series B Mixed Signal Oscilloscope Features TekVPI Probe Interface
Offers signal fidelity with12-bit ADCs and extremely low noise, 10 GHz bandwidth and up to 8 FlexChannel™ inputs. Comes with removable SSD with optional security licenses and enables use of the oscilloscope in secure environments by minimizing cybersecurity threats. Ideal for diverse applications in semiconductors, power integrity, automotive, defense, and aerospace.
Read More »New Real-Time Dashboards Automate Triggers and Alerts Based on Incoming Data
Integration between DAQ6510 and DMM6500 instruments with Initial State, an loT dashboard for data streaming and visualization for remote data access. Makes it possible to interpret data without the need to utilize third party software. Users can monitor and analyze an experiment remotely in any browser – including on mobile devices.
Read More »New Real-Time Dashboards Automate Triggers and Alerts Based on Incoming Data
Integration between DAQ6510 and DMM6500 instruments with Initial State, an loT dashboard for data streaming and visualization for remote data access. Makes it possible to interpret data without the need to utilize third party software. Users can monitor and analyze an experiment remotely in any browser – including on mobile devices.
Read More »New 2601B-PULSE Measuring Instrument Eliminates Manual Pulse Output Tuning
Features PulseMeter™ technology for sourcing current pulses as short as 10μsec at 10A and 10V. Offers built-in dual 1 MS/sec,18-bit digitizers that enhance pulser's measurement function, enabling users to acquire pulse current and voltage waveforms. Ideal for testing VCSELs and LEDs, semiconductor device characterization, fault power management testing, and surge protection testing.
Read More »New 2601B-PULSE Measuring Instrument Eliminates Manual Pulse Output Tuning
Features PulseMeter™ technology for sourcing current pulses as short as 10μsec at 10A and 10V. Offers built-in dual 1 MS/sec,18-bit digitizers that enhance pulser's measurement function, enabling users to acquire pulse current and voltage waveforms. Ideal for testing VCSELs and LEDs, semiconductor device characterization, fault power management testing, and surge protection testing.
Read More »New Isolated Oscilloscope Probes Available in Bandwidths Ranging from 200 MHz to 1 GHz
Offers combination of high bandwidth, dynamic range and best-in-class CMRR over the probe's full bandwidth. Probes are more sensitive, with less noise at +/- 50V measurements for high visibility. Uses electro-optical technologies to capture signals and power the probes without the need for an electrical connection.
Read More »New Isolated Oscilloscope Probes Available in Bandwidths Ranging from 200 MHz to 1 GHz
Offers combination of high bandwidth, dynamic range and best-in-class CMRR over the probe's full bandwidth. Probes are more sensitive, with less noise at +/- 50V measurements for high visibility. Uses electro-optical technologies to capture signals and power the probes without the need for an electrical connection.
Read More »New S530 Series Parametric Test System Comes with Built-In Transient Over-Voltage / Over-Current Protection
Enables semiconductor fabs to add parametric test capacity for high-growth new technologies while minimizing CAPEX investment and maximizing wafers per hour efficiency. Enables testing up to 1100V on any pin to boost throughput by 50 percent or more over competitive systems in power and WBG applications. Offered with KTE 7 software that simplifies and speeds up the migration path and achieves...
Read More »New S530 Series Parametric Test System Comes with Built-In Transient Over-Voltage / Over-Current Protection
Enables semiconductor fabs to add parametric test capacity for high-growth new technologies while minimizing CAPEX investment and maximizing wafers per hour efficiency. Enables testing up to 1100V on any pin to boost throughput by 50 percent or more over competitive systems in power and WBG applications. Offered with KTE 7 software that simplifies and speeds up the migration path and achieves...
Read More »New 6 Series B Mixed Signal Oscilloscope Features TekVPI Probe Interface
Offers signal fidelity with12-bit ADCs and extremely low noise, 10 GHz bandwidth and up to 8 FlexChannel™ inputs. Comes with removable SSD with optional security licenses and enables use of the oscilloscope in secure environments by minimizing cybersecurity threats. Ideal for diverse applications in semiconductors, power integrity, automotive, defense, and aerospace.
Read More »New 6 Series B Mixed Signal Oscilloscope Features TekVPI Probe Interface
Offers signal fidelity with12-bit ADCs and extremely low noise, 10 GHz bandwidth and up to 8 FlexChannel™ inputs. Comes with removable SSD with optional security licenses and enables use of the oscilloscope in secure environments by minimizing cybersecurity threats. Ideal for diverse applications in semiconductors, power integrity, automotive, defense, and aerospace.
Read More »New Real-Time Dashboards Automate Triggers and Alerts Based on Incoming Data
Integration between DAQ6510 and DMM6500 instruments with Initial State, an loT dashboard for data streaming and visualization for remote data access. Makes it possible to interpret data without the need to utilize third party software. Users can monitor and analyze an experiment remotely in any browser – including on mobile devices.
Read More »New Real-Time Dashboards Automate Triggers and Alerts Based on Incoming Data
Integration between DAQ6510 and DMM6500 instruments with Initial State, an loT dashboard for data streaming and visualization for remote data access. Makes it possible to interpret data without the need to utilize third party software. Users can monitor and analyze an experiment remotely in any browser – including on mobile devices.
Read More »New 2601B-PULSE Measuring Instrument Eliminates Manual Pulse Output Tuning
Features PulseMeter™ technology for sourcing current pulses as short as 10μsec at 10A and 10V. Offers built-in dual 1 MS/sec,18-bit digitizers that enhance pulser's measurement function, enabling users to acquire pulse current and voltage waveforms. Ideal for testing VCSELs and LEDs, semiconductor device characterization, fault power management testing, and surge protection testing.
Read More »New 2601B-PULSE Measuring Instrument Eliminates Manual Pulse Output Tuning
Features PulseMeter™ technology for sourcing current pulses as short as 10μsec at 10A and 10V. Offers built-in dual 1 MS/sec,18-bit digitizers that enhance pulser's measurement function, enabling users to acquire pulse current and voltage waveforms. Ideal for testing VCSELs and LEDs, semiconductor device characterization, fault power management testing, and surge protection testing.
Read More »